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Semiconductor device forming method

一种半导体、器件的技术,应用在半导体器件的形成领域,能够解决工艺复杂、品质因数低、集成度低等问题

Active Publication Date: 2016-06-29
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] However, the quality factor Q of existing planar inductors is too low, and the process steps for forming planar inductors are less integrated with the process steps for forming other semiconductor devices, making the process more complicated

Method used

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Embodiment Construction

[0035] As mentioned in the background art, the quality factor Q of the existing planar inductors is too low, and the process steps for forming planar inductors are less integrated with the process steps for forming other semiconductor devices, making the process more complicated.

[0036] After research, please continue to refer to figure 1 and figure 2 , taking the planar inductor located on the surface of the semiconductor substrate 100 as an example, when the planar inductor works, there is current in the planar spiral coil 102 , and the spiral current can generate an inductive magnetic field perpendicular to the semiconductor substrate 100 . According to Lenz's theorem, the inductive magnetic field penetrating vertically into the semiconductor substrate 100 will induce an induced current in the semiconductor substrate 100 , and the direction of the induced current is opposite to the direction of the current in the planar spiral coil 102 . The induced current can also gener...

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Abstract

The invention discloses a semiconductor device forming method, and the method comprises the steps: providing a substrate with a first region and a second region, wherein the surface of the substrate is provided with a first dielectric layer and the surface of the first region of the substrate is provided with a conductive plug; forming a second dielectric layer on the surface of the first dielectric layer, wherein the interior of the second dielectric layer is provided with a plurality of first openings; exposing the top of the conductive plug at the bottom of the first opening in the first region; forming a first conductive layer in the first opening; then carrying out the etching of the second dielectric layer and the first dielectric layer of the second region till the substrate is exposed, so as to form a second opening; forming a passivation region in the substrate at the bottom of the second opening; exposing the surface of the first dielectric layer of the second region; forming third dielectric layers in the second opening and on the surface of the first dielectric layer, wherein the surfaces of the third dielectric layers are aligned with the surfaces of the second dielectric layer and the first dielectric layer located in the first region; and forming third conductive layer on the surfaces of the third dielectric layers. The method improves the performance of a formed semiconductor device, and simplifies the forming steps.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a method for forming a semiconductor device. Background technique [0002] In an existing integrated circuit, such as a radio frequency front-end module (RFFEM), an inductor is an important electrical device, and its performance parameters directly affect the performance of the integrated circuit. In the prior art, most of the inductors in integrated circuits use planar inductors, such as planar spiral inductors; the planar spiral inductors are formed by winding metal wires on the surface of a substrate or a dielectric layer; compared with traditional wire wound inductors, planar inductors The device has the advantages of low cost, easy integration, low noise and low power consumption, and more importantly, it is compatible with today's integrated circuit technology. [0003] Please refer to figure 1 and figure 2 , is a schematic structural diagram of a pl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02
CPCH01L21/02164H01L21/02271H01L21/3065H01L21/3081H01L21/31116H01L21/31144H01L21/76264H01L23/5227H01L23/53295H01L27/0617H01L28/10H01L2924/0002H01L2924/00H01L21/0332H01L21/2885H01L21/3212H01L21/76802H01L21/7684H01L21/76877H01L23/3171H01L23/5226H01L23/528H01L23/53228H01L27/0641H01L27/0676
Inventor 包小燕葛洪涛
Owner SEMICON MFG INT (SHANGHAI) CORP