Optimization method of open circuit test path for flying probe tester
A flying probe testing machine and open-circuit testing technology, which is applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as unreachable efficiency, time complexity, and model building
Active Publication Date: 2018-03-23
CHONGQING UNIV
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But they did not build a model based on the characteristics of the flying probe tester, because the time complexity was too high to achieve good efficiency
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[0069] see figure 1 , a flying probe testing machine open circuit test path optimization method, the method comprises the following steps:
[0070] A. Read and organize the information required for path optimization. For the specific operation process, please refer to image 3 Shown, can carry out according to step A1~A6 in specific embodiment:
[0071] A1. Read the conti.lst file that needs to be optimized line by line, extract the positive and negative valid points in each line, and put them into the positive testable point container and the negative testable point container;
[0072] The flying probe test machine reads the conti.lst file as input, we optimize the original file, and generate a new conti.lst file, conti is the keyword in the file name, and the file name can be named continew, etc., .lst is the format name of the file. The optimization effect can be compared by comparing the total moving distance of the original conti.lst file and the new conti.lst file.
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The invention provides a flying probe tester open-circuit test path optimization method. The method is characterized by comprising the following steps: A, reading and processing information needed for path optimization; B, cyclically pairing points of each network, and then merging pairs, wherein the B step comprises: B1, establishing a first container to a thirteenth container; B2, respectively reading front-surface points and back-surface points of the same network from a front-surface testable point container and a back-surface testable point container for storing in the first container and the second container; B3, re-ordering the points in the first container and the second container; B4, carrying out open-circuit pairing; and B7, merging the pairs, and after merging, placing the pairs into the thirteenth container; C, carrying out open-circuit optimization; and D, generating a test file, i.e., after the open-circuit optimization is finished, generating a new CONTI.LST file. Compared to conventional software, the method can optimize test time by 30% and can shorten the test time by 50%; and the method can be widely applied to printed circuit board manufacturing and testing industries.
Description
technical field [0001] The invention relates to the technical field of printed board testing, in particular to a method for optimizing an open circuit test path of a flying probe tester. Background technique [0002] Printed circuit board (PCB) is an information carrier integrating various electronic components, and has been widely used in various fields. With the continuous development of technology and continuous progress of industry, electronic products tend to be lighter, thinner, shorter and smaller, which also makes PCB manufacturing technology develop towards higher density. How to efficiently inspect high-density PCBs and reduce inspection costs in a highly automated production site has always been a difficult problem for researchers. At present, the testing methods in the process of PCB production in my country are relatively simple, among which flying probe testing is a main testing method, but the existing flying probe testing machines have low operation efficien...
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IPC IPC(8): G01R31/28
CPCG01R31/2812
Inventor 周尚波李文琛吴小雨陈淑芳
Owner CHONGQING UNIV