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Thin film structure and surface control method therefor

A thin-film structure and thin-film technology, which is applied in the field of spacecraft structure deformation control, can solve the problems such as the reduction of the accuracy of the thin-film front shape and surface

Active Publication Date: 2016-11-09
NAT UNIV OF DEFENSE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to solve the problem that the precision of the thin film front surface will be reduced due to the interference load when the thin film structure is in orbit, the present invention proposes a thin film structure and its shape control method

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  • Thin film structure and surface control method therefor
  • Thin film structure and surface control method therefor
  • Thin film structure and surface control method therefor

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Embodiment Construction

[0065] figure 1 It is a film structure provided by the present invention, including a film front 100, a peripheral tension cable 101, a frame 102 and a tension point 103, the film front 100 is fixed in the frame 102, and the film front 100 is located on the xoy plane Above, the four sides of the film front 100 are provided with peripheral tension cables 101, and the periphery of the film front 100 is provided with tension through the peripheral tension cables 101, and the peripheral tension cables 101 are fixed on the frame 102 through a plurality of tension points 103. On the adjustment structure 104, the tension point 103 is in one-to-one correspondence with the adjustment mechanism 104. The adjustment mechanism 104 is vertically installed on the frame 102, and the height of the adjustment structure 102 in the z direction is controlled to change the height of the tension point 103, which can realize The flatness control of the thin film front during the orbital operation of ...

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Abstract

The invention provides a thin film structure and a surface control method therefor. The thin film structure comprises a thin film array surface, peripheral tension cables, a frame, tension points and adjusting mechanisms, wherein the peripheral tension cables are arranged on four corners of the thin film array surface; a tension force is provided through the peripheral tension cables at the periphery of the thin film array surface; the peripheral tension cables are fixed to the adjusting mechanisms on the frame through the tension points; and the height of the tension points is changed by controlling the height of the adjusting mechanism in a direction facing to outside, so that the planarity control of the thin film array surface of the thin film structure in an in-orbit operation process can be realized. According to the surface control method proposed by the invention, an adjusting amount of the adjusting mechanism is calculated according to three-dimensional surface data of the thin film array surface so as to enable the surface precision of the thin film array surface to meet the design requirements. According to the thin film structure and the surface control method, the problem of reduced surface precision of the thin film array surface of the thin film structure caused by the interference load effect during in-orbit operation is solved and the surface precision of the thin film structure is improved.

Description

technical field [0001] The invention relates to the field of deformation control of spacecraft structures, in particular to a thin film structure and a method for controlling its shape. Background technique [0002] Thin-film structures, such as solar sails, thin-film solar cell arrays, thin-film antenna structures, thin-film mirror structures, etc., have been more and more widely used in the aerospace field due to their advantages of large area, light weight, and small storage volume. Due to the large area of ​​the film structure, low stiffness, and weak damping, it is prone to deformation under interference conditions such as thermal loads, attitude maneuvering loads, and orbital maneuvering loads, and its shape and surface accuracy is difficult to maintain. However, the reduction of the surface accuracy of the film will seriously affect the implementation of space missions, or lead to a decline in work performance. [0003] In the existing solutions, the initial shape an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/17G06F30/20
Inventor 许睿李东旭蒋建平邹杰刘望
Owner NAT UNIV OF DEFENSE TECH