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Magnet ring surface defect extraction method based on mask technology

An extraction method and magnetic ring technology, which is applied in the field of magnetic ring surface defect extraction based on mask technology, can solve problems such as wrong picking and missing detection, and achieve the effects of high accuracy, high operating efficiency, and stable algorithm

Inactive Publication Date: 2017-01-04
ZHEJIANG SCI-TECH UNIV
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to overcome the shortcomings of manual detection in the prior art that are prone to false detection and missed detection, and to provide a method for extracting magnetic ring surface defects based on mask technology with high detection accuracy and high detection efficiency

Method used

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  • Magnet ring surface defect extraction method based on mask technology
  • Magnet ring surface defect extraction method based on mask technology
  • Magnet ring surface defect extraction method based on mask technology

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Embodiment Construction

[0035] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0036] Such as figure 1 The illustrated embodiment is a method for extracting surface defects of a magnetic ring based on mask technology, such as figure 2 As shown, from left to right: original image S(X, Y), binary image B(X, Y), mask image M R×R (X, Y), mask image P R×R (X, Y), defect connected domain image K(X, Y), including the following steps:

[0037] Step 100, using 0TSU to segment the magnetic ring image to obtain a magnetic ring binary image B (X, Y);

[0038] Step 200, using the least squares method to fit the inner and outer contours of the magnetic ring image, and calculating the inner and outer diameters of the magnetic ring and the coordinates of the center of the circle;

[0039] Set all points of the outer contour of the magnetic ring as N i (X, Y), all points of the inner contour are n j (X, Y), the equation of the firs...

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Abstract

The present invention discloses a magnet ring surface defect extraction method based on the mask technology. The method comprises the following steps: employing an OTSU segmentation magnet ring image to obtain a magnet ring binary image B(X, Y); fitting the inner and outer contours in the magnet ring image by using the least square to calculate the diameter of the magnet ring and the coordinates of the center of a circle; constructing a mask image MR*R(X, Y) and PR*R(X, Y); and performing operation of the mask image MR*R(X, Y) and PR*R(X, Y) to obtain a defect connected domain image K(X, Y). The magnet ring surface defect extraction method based on mask technology is high in operation efficiency, high accuracy, high stability and high robustness and can identify common defects.

Description

technical field [0001] The invention relates to the technical field of computer vision, in particular to a method for extracting surface defects of a magnetic ring based on a mask technology with high detection accuracy and high detection efficiency. Background technique [0002] Ferrite magnetic rings are widely used in rice cookers, induction cookers, audio and other products, and are also commonly used anti-interference components in electronic circuits, which have a good suppression effect on high-frequency noise. However, in the process of forming the magnetic ring, uneven stirring of raw materials or mixed impurities, wear of the forming mold, improper temperature control of the sintering process, or uneven heating of the semi-finished product will cause surface defects such as cracks, adhesions, and crystallization of the magnetic ring. And drop corners, etc. Surface defects will directly affect the quality of the magnetic material in the later stage, resulting in lo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
CPCG06T7/0004
Inventor 李俊峰张之祥沈军民陈龙
Owner ZHEJIANG SCI-TECH UNIV