A Method of Analyzing the Local Dark Current of Cells Based on El Image

Abstract

The invention discloses a method for analyzing a battery local dark current based on an EL image. The method comprises the following steps: (1) introducing different currents into a battery and utilizing a portable EL tester to shoot EL images under different current; (2) utilizing PS image processing to acquire grey values of the EL images; (3) acquiring a relational expression between the current and the electroluminescence strength under the corresponding current; (4) measuring local electroluminescence strength and adopting the relational expression between the current and the electroluminescence strength under the corresponding current for acquiring the local current; (5) utilizing the formula shown in the description to calculate the local dark current. According to the invention, the performance of the battery can be recognized by analyzing the performance of the battery local dark current based on the EL image, the invalid risk of the component can be reduced and the reliability of the component can be increased.

Description

technical field [0001] The invention relates to a method for analyzing local dark current of a solar cell based on an EL image, and belongs to the technical field of photovoltaic modules. Background technique [0002] Traditional energy is facing the crisis of gradual exhaustion, and mankind needs to develop new energy to replace traditional energy. The development of solar energy is one of the main ways to solve environmental problems and energy shortage problems. How to effectively improve the efficiency of solar cell modules is very important. Due to the defects of the battery itself, the solar cell has hot spot failure and other phenomena. Serious hot spot phenomenon will burn part of the battery and cause permanent damage to the module, reducing the service life of the module. [0003] However, in the production process of crystalline silicon cells, various types of solar cells have defects due to environmental or water pollution, stress during processing, and operati...

AI Technical Summary

Problems solved by technology

[0003] However, in the production process of crystalline silicon cells, due to environmental or water pollution, stress during processing, and operational errors, etc., the defects of different types of solar cells have been caused.

More serious defects will lead to a large reverse leakage current in the solar cell. In the case of severe point leakage, it will cause the solar cell to "burn through". However, the impact of defects on the current and voltage of the cell has not been studied in depth. The study, therefore, provides a way to study the local dark current of cells using EL images, which is very important for further analysis of the failure mechanism of defective cells on photovoltaic modules

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