Multi-frequency sinusoidal voltage excitation waveform parameter optimization method for fast frequency domain dielectric response test
A technology of dielectric response and excitation waveform, which is applied in the direction of dielectric property measurement, resistance/reactance/impedance measurement, measurement device, etc. It can solve the problems of consuming more test time, long measurement time, and limited application, etc., and achieve crest factor The effect of reducing, improving the signal-to-noise ratio, and accurately measuring
Active Publication Date: 2019-06-04
STATE GRID HENAN ELECTRIC POWER ELECTRIC POWER SCI RES INST +2
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Problems solved by technology
This method has the advantages of easy generation and analysis of signals, but the biggest defect is that the measurement time at low frequencies is too long, which greatly limits the application of this method
For example, to complete the test in the frequency range of 0.1mHz to 1kHz, each frequency point signal samples one cycle, and only one frequency point of 0.1mHz takes 2.78h
If 6 frequency points are taken for every ten-fold frequency, it will take about 9 hours, and in order to stabilize the response current, sometimes each frequency point may sample multiple cycles, which will consume more test time. In terms of power outage maintenance time, it is unacceptable
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[0023] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0024] In order to better understand the technical solution of the present invention, firstly, the single-frequency and multi-frequency sinusoidal excitation frequency-domain dielectric spectrum testing techniques are introduced.
[0025] Single-frequency sinusoidal excitation frequency-domain dielectric spectrum testing technology
[0026] A standard sinusoidal AC voltage signal with frequency f Added to the insulating medium, the current signal of the same frequency generated in the medium is i(t)=Bsin(2π f+θ), and the voltage and current are respectively recorded as Angular frequency ω=2π·f, then there is
[0027]
[0028] In the formula is the complex capacitance of the insulation system, C' is the real part of the complex capacitance, which is related to the ability of the medium to bind charges; C″ is the imaginary part of th...
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The present invention relates to a multi-frequency sinusoidal voltage excitation waveform parameter optimization method for rapid frequency-domain dielectric response testing, comprising the following steps: Step S1. Determine the number of multi-frequency sinusoidal waves required according to fL-fH of the section to be tested, and then according to fi =i·f1, i∈N+ determine each harmonic frequency fi under different fundamental frequencies; step S2. According to the sample resistance Req and capacitance Ceq, determine ωH by ωHReqCeq=10, ωH is optimized for different amplitudes of multi-frequency sinusoidal harmonics The critical corner frequency of the policy. Harmonic amplitude optimization is performed with reference to the relationship between ωH and harmonic frequency; step S3. After harmonic frequency and amplitude optimization, phase optimization is finally performed. The present invention is based on multi-frequency sine wave voltage excitation, focusing on the frequency, amplitude and phase optimization methods of the excitation waveform: the proper selection of the frequency can make the total measurement time the shortest when the harmonic bandwidth is constant; after the amplitude is optimized, it can be more accurate The weak response current can be measured accurately; after the phase optimization, the crest factor of the multi-frequency sinusoidal voltage decreases, and the signal-to-noise ratio of the excitation signal is improved.
Description
technical field [0001] The invention relates to a multi-frequency sinusoidal voltage excitation waveform parameter optimization method for rapid frequency-domain dielectric response testing. Background technique [0002] Frequency Domain Spectroscopy (FDS) based on dielectric response has the advantages of strong anti-interference ability and non-destructive to the tested sample, and is widely used in the analysis of dielectric properties of dielectric insulating materials. In recent years, the application of this testing technology in the field of insulation state assessment and diagnosis of power transmission and transformation equipment has attracted widespread attention from scholars at home and abroad, and a lot of research work has been carried out. Commercially available dielectric spectrum testing and analysis instruments have been developed and gradually applied to frequency domain dielectric spectrum testing of transformer main insulation and diagnosis of moisture ...
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IPC IPC(8): G01R27/26
CPCG01R27/2617
Inventor 付刚郑含博杨丽君王松华寇晓适王伟李予全邵颖彪钱诗林赵磊马伦
Owner STATE GRID HENAN ELECTRIC POWER ELECTRIC POWER SCI RES INST