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Test Method for Switching Hall Sensor Noise

A technology of Hall sensor and test method, which is applied in the field of sensor test and can solve problems such as BOP/BRP noise performance difficulties

Active Publication Date: 2019-06-14
SHANGHAI MAIGEEN MICROELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Unfortunately, most current magnetic field generators cannot generate high-frequency alternating magnetic fields, so it is extremely difficult to test the noise performance of the switch-type Hall sensor BOP / BRP

Method used

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  • Test Method for Switching Hall Sensor Noise
  • Test Method for Switching Hall Sensor Noise
  • Test Method for Switching Hall Sensor Noise

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Embodiment 1

[0034] The invention discloses a test method for the noise of a switch-type Hall sensor. The test method is to indirectly measure the noise performance of the sensor by observing the power-on process of the sensor. The test principle diagram is shown in Figure (4): the switch-type Hall sensor The sensor is placed in the magnetic field generator; the sensor is powered by the square wave signal output by the signal generator. The amplitude of the square wave signal is 0 to VDD. VDD is the working voltage of the sensor chip, and the cycle is 2*(Tpu+N*Ts) , Tpu is the power-on time of the sensor chip, Ts is the sampling period of the sensor chip, N takes an integer between 5 and 10, and the duty cycle is 50%; use an oscilloscope to detect the output of the sensor, and the oscilloscope is set to trigger on the rising edge. The source is a square wave generated by a signal generator, and the persistence time is set to infinity.

[0035] If the power-on initial state of the sensor ch...

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Abstract

The invention discloses a method for testing the noise of a switching-type Hall sensor. The method indirectly tests the noise performance of the sensor by observing the power-up process of the sensor and comprises steps of: placing the switching-type Hall sensor in a magnetic field generator; powering the sensor with a square signal output by a signal generator, wherein the amplitude of the square signal is from 0 to VDD, the VDD is the operating voltage of the sensor chip, the cycle of the square signal is 2*(Tpu + N*Ts), Tpu is the power-up time of the sensor chip, Ts is the sampling cycle of the sensor chip, N is an integer between 5 and 10, the duty cycle of the square signal is 50%; detecting the output of the sensor with a oscilloscope, wherein the oscilloscope is configured to be triggered by rising edges, a trigger source is a square wave generated by a signal generator, and persistence time is set as infinity. The method obtains a high-frequency power supply voltage source by using the signal generator on the premise of the known power-up initial state of the chip, and obtains the upper and lower limits of the BOP / BRP by observing the statistical characteristic of the power-up process of the sensor so as to obtain the noise characteristics of the switching-type Hall sensor.

Description

technical field [0001] The invention belongs to the technical field of sensor testing, and relates to a sensor noise testing method, in particular to a switching type Hall sensor noise testing method. Background technique [0002] The Hall sensor is a magnetic field sensor made according to the Hall effect. It has a wide range of applications in the automotive industry, including power, body control, traction control, and anti-lock braking systems. In order to meet the needs of different systems, Hall sensors are divided into two types: linear Hall sensors and switch Hall sensors. Noise performance, as an important indicator of Hall sensors, plays a vital role in the design of Hall sensors, especially high-sampling rate and high-precision switching Hall sensors. The specific manifestation of noise in a switching Hall sensor is that it causes random changes in the switching threshold of the sensor. [0003] figure 1 Shown is the input and output characteristics of an ideal...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
CPCG01R35/00
Inventor 陆游朱剑宇
Owner SHANGHAI MAIGEEN MICROELECTRONICS CO LTD
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