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Method for detecting Mura defects

A defect and inspection area technology, applied in the direction of nonlinear optics, instruments, optics, etc., can solve problems such as indefinite shape and irregularity, achieve obvious detection effect and improve the effect of Mura detection ability

Active Publication Date: 2017-05-10
NANJING CEC PANDA LCD TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] Purpose of the invention: the purpose of the present invention is to solve the deficiencies in the prior art and provide a method for detecting Mura defects, which overcomes the types of defects such as irregular, amorphous Mura and sudden bad Mura that occur in the liquid crystal panel manufacturing industry The problem of missed detection

Method used

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  • Method for detecting Mura defects

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Embodiment 1

[0048]Taking the edge Mura as an example, the inspection area of ​​the LCD panel is set in the upper half of the LCD panel for this type of Mura, and then the inspection area is divided into 9 blocks, so that the defects are concentrated in the upper left block, respectively. Calculate the four parameters of 9 blocks, through the comparison of each parameter, it can be found that the average luminance value, the maximum luminance value, and the minimum luminance value have no obvious difference between the defective area and the non-defective area, and the standard deviation of the luminance The value 35.39 (upper left corner) of the block where the defect is located is obviously larger than the other 8 blocks, so the defect can be detected by comparing the standard deviation value. The block where the standard deviation value differs is where the defect is located.

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Abstract

The invention discloses a method for detecting Mura defects. The method comprises the steps of manually moving a rectangular checking area of an LED panel to a corresponding defect location of the panel based on actual defect types, at the same time checking the size of the area, based on the actual defect types, manually dividing the moved checking area into several small patches, after the patches are divided, collecting brightness values of each CCD of each patch, calculating four values including an average brightness value, maximum brightness value, minimum brightness value and brightness standard deviation value of each patch, after calculating the parameters, comparing the parameters to single out the patches with abnormal parameters which are the precise location of the defects. The method for detecting Mura defects solves the problems of the omission of the defects such as indefiniteness, abnormal Mura and sudden bad Mura in LED panel manufacturing industry, has an obvious detection effect with good success rate in practical application, enhances the Mura detection capability, and makes the detection more effective and accurate.

Description

technical field [0001] The invention belongs to liquid crystal panel detection technology, in particular to a Mura defect detection method. Background technique [0002] Mura defect is a common visual defect in TFT-LCD, manifested as areas of low contrast, non-uniform brightness, and blurred edges, usually larger than one pixel, which will bring visual discomfort to the observer. At the same time, mura defects are also the most complex and difficult to detect among visual defects. At present, professionally trained inspectors are usually used in the industry to detect with the human eye comparison method based on the limit samples, which inevitably introduces factors such as subjective identification, which is prone to inaccuracies. Reliable judgment results with low efficiency. In recent years, researchers have begun to study the use of machine vision to replace human eyes for detection, and most of them use the method of brightness comparison of adjacent areas. [0003] ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 杨阳蔡扬张梅金
Owner NANJING CEC PANDA LCD TECH