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Handling method for fast SDD detector signal

A signal processing and detector technology, applied in the X-ray energy spectrum distribution measurement, etc., can solve the problems affecting the energy resolution of the detector

Inactive Publication Date: 2017-05-17
CHENGDU UNIVERSITY OF TECHNOLOGY
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Problems solved by technology

Due to the problem of charging and discharging the internal capacitance of the detector, it may cause problems in the formation of slow pulses, and the wrong pulses will be recorded, which will affect the energy resolution of the detector.

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  • Handling method for fast SDD detector signal
  • Handling method for fast SDD detector signal
  • Handling method for fast SDD detector signal

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Embodiment Construction

[0015] In order to make the object, technical solution and advantages of the invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and examples.

[0016] In order to eliminate the false peaks generated by the fast SDD detector at high count rate and slow shaping, and improve the energy resolution of the detector, a spectral signal processing method of the fast SDD detector is provided.

[0017] A fast SDD detector spectral signal processing method provided by the present invention is characterized in that it can not only eliminate the false peaks that appear before the full energy peak of the element, but also improve the energy resolution of the detector. The specific steps are as follows:

[0018] A. First, use the CR differential circuit to convert the step signal output by the detector into a negative index signal for subsequent processing;

[0019] B. Due to the influence of the internal capacitance ...

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Abstract

The invention discloses a handling method for a fast SDD detector signal. Aim at a problem that a false peak is appeared before a total energy peak after a slow formation of a fast SDD output signal with high counting rate, the method puts forward a method for handling an impulse by judging a relationship between a formation time and a rise time of a formation of a triangle convolution. The method not only can basically eliminate the false peak, but also can improve an energy resolution of the fast SDD. A fast formation of the fast SDD does not appear the situation, but the energy resolution is lower in this technical rate which cannot meet a need of the practical application. Aim at a 55 Fe energy resolution (FWHM) with the 5.89KeV energy, a fast formation is better to reach 130 eV, an unimproved slow formation is better to reach 125 eV, but an improved slow formation can reach 122 eV.

Description

technical field [0001] Aiming at the problem that false peaks appear before the all-energy peak and affect the energy resolution of the detector when the fast SDD detector is formed slowly at a high count rate, the invention proposes a spectrum processing method for the fast SDD detector. Background technique [0002] Energy dispersive X-ray fluorescence instrument is widely used because of its fast, accurate and non-destructive measurement. However, in recent years, the accuracy and precision of various element detection are very high, and the improvement of the detector has played a key role. High-performance silicon drift detectors (fast SDD) are gradually replacing silicon drift detectors (SDD). Currently the best performing fast SDD is measured to 55 The spectral peak of the Fe radioactive source is 5.9keV, and its energy resolution reaches 125eV. There are also research institutes in China to make and improve SDD, and have achieved certain results. However, in some ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/36
CPCG01T1/36
Inventor 万文杰周建斌喻杰洪旭费鹏李延鹏
Owner CHENGDU UNIVERSITY OF TECHNOLOGY