Partial scanning-based integrated circuit fault injection attack simulation method
A technology of fault injection and integrated circuits, applied in the direction of electronic circuit testing, measuring electricity, measuring electrical variables, etc., can solve the problems of high resource consumption and large resource consumption, and achieve the effect of low resource consumption and reduced resource consumption
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[0020] The present invention will be further described below in conjunction with the drawings.
[0021] Such as figure 1 As shown, a partial scan-based integrated circuit fault injection attack simulation method of the present invention solves the problem of high resource consumption in the existing integrated circuit fault injection attack simulation method, which specifically includes the following steps:
[0022] Step 1: Extract the target register for fault injection
[0023] The source code of the circuit design to be tested (ie, the hardware description source code for the circuit to be tested) is integrated into the original netlist, the target variable for fault injection is set, and the target register for fault injection is extracted.
[0024] Step two, partial scan insertion
[0025] Use heuristic algorithm or other algorithms to select some registers from the original netlist as scan registers, insert the scan chain and fault injection control module into the original netli...
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