Method and system for prolonging service cycle of TLC Nand flash memory
A flash memory, one block technology, applied in a method of increasing the life cycle of TLCNand flash memory and its system field, can solve the problem of limited erasing and writing times, and achieve the effect of increasing the life cycle and reducing costs
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0053] Please refer to figure 2 , Embodiment 1 of the present invention is: a method for increasing the service life of TLC Nand flash memory, which can not only prolong the service life of TLC Nand flash memory, but also greatly reduce the production cost of digital products. include:
[0054] S1. Determine whether there is a bad block in the block of the TLC Nand flash memory, and if so, execute step S2. Since the process of Nand flash memory cannot guarantee the reliable performance of Nand Memory Array during its life cycle, Nand flash memory will generate bad blocks during production and use. Bad blocks generated during production become inherent bad blocks, and bad blocks generated during use become used bad blocks. If an error occurs when programming a certain Page of the first block, this block should be marked as a bad block. First, the contents of the pages of other numbers must be backed up to another empty good block, and then, Mark this block as a bad block. O...
Embodiment 2
[0063] Please refer to Figure 4 , embodiment two of the present invention is corresponding to the method in embodiment one, is a kind of system that increases the life cycle of TLC Nand flash memory, comprising:
[0064] Judging module 1, for judging whether there is bad block in the block of TLC Nand flash memory; Described judging module comprises: reading unit 11, is used for if erase operation is carried out to one piece in the block of TLC Nand flash memory, then reads all The error correction code of one block; Judgment unit 12, is used to judge whether described error correction code meets the preset condition that error correction can be carried out; Judgment unit 13, is used for if not, then judges that described one is bad block;
[0065] Setting module 2 is used to set the bad block to SLC storage mode if so.
[0066] Create module 3 for creating bad block table;
[0067] The adding module 4 is used to add the bad block to the bad block table.
[0068] Create a ...
PUM

Abstract
Description
Claims
Application Information

- R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com