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Optical measurement system and optical imaging system

A technology of optical measurement system and optical imaging system, which is applied in measurement devices, material analysis through optical means, scientific instruments, etc., and can solve problems such as inability to sense, light source light is too oblique, etc.

Active Publication Date: 2019-10-15
TEST RES INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this design may cause the light from the light source to be too oblique, so that the reflected light falls outside the receiving range of the photosensitive element, resulting in a situation where it cannot be sensed

Method used

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  • Optical measurement system and optical imaging system
  • Optical measurement system and optical imaging system
  • Optical measurement system and optical imaging system

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Embodiment Construction

[0024] A number of embodiments of the present invention will be disclosed below with the accompanying drawings. For the sake of clarity, many practical details will be described together in the following description. It should be understood, however, that these practical details should not be used to limit the invention. That is, in some embodiments of the present invention, these practical details are unnecessary. In addition, for the sake of simplifying the drawings, some known and commonly used structures and elements will be shown in a simple and schematic way in the drawings.

[0025] Figure 1A is a schematic diagram of an optical measurement system 100 according to an embodiment of the present invention. The optical measurement system 100 includes a lens module 110 , a light source module 120 and a photosensitive element 130 . The lens module 110 includes a first lens assembly 112 and a second lens assembly 114 . The first lens assembly 112 is disposed between the se...

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Abstract

The present invention discloses an optical measurement system and an optical imaging system. The optical measurement system comprises a lens module, a light source module and a photosensitive element, wherein the lens module comprises a first lens assembly and a second lens assembly, the first lens assembly is arranged between the second lens assembly and an object side, the first lens assembly and the second lens assembly co-have an optical axis, the light source module is arranged between the first lens assembly and the second lens assembly and is provided with an opening, the optical axis penetrates through opening, the light source module is used for emitting light to the object side through the first lens assembly, the photosensitive element is positioned on the lens module side opposite to the object side, and is used for receiving the object light from the object side, wherein the object light passes through the lens module and the opening of the light source module. In the optical measurement system of the present invention, the light source module can be close to the optical axis as more as possible in the case of no influence on the object light so as to provide the light close to the optical axis.

Description

technical field [0001] The invention relates to an optical measuring system and an optical imaging system. Background technique [0002] In recent years, due to the reduction in the size of components, many automated high-precision testing equipment have been developed to detect various tiny parts and even various samples. These detection devices obtain the information of the sample to be tested by detecting the light reflected by the sample to be tested. Among them, how to arrange both the light source and the photosensitive element on the optical path of the detection device is an important issue. [0003] In some detection devices, a beam splitter is usually provided to couple the light transmission path of the light source and the transmission path of the light received by the photosensitive element, so that the reflected light can be effectively captured by the photosensitive element. However, the setting of the beam splitter often reduces the light intensity, resulti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/17
Inventor 王湧锋余良彬
Owner TEST RES INC