High temperature test device
A technology of testing equipment and equipment, which is applied in the direction of environment/reliability testing, measuring electricity, measuring devices, etc., can solve the problem that the service life of power supply and signal generator is reduced and cannot meet the external requirements of power supply and signal generator and other problems to achieve the effect of preventing life reduction
Inactive Publication Date: 2017-08-22
HKC CORP LTD +1
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Problems solved by technology
[0002] During the high-temperature test of the display panel, such as the burn-in test, due to the increase in the size of the display panel and the limitation of the length of the power line and signal line, it is no longer possible to meet the requirements of externally placing the power supply and signal generator, that is, the The power supply, signal generator and display panel are subjected to the corresponding high temperature test
However, long-term high-temperature environment will reduce the life of the power supply and signal generator
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[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0020] see Figure 1 to Figure 3 , as shown in the figure, a high temperature testing device 10 includes a trolley 20 , a furnace body 30 , and a door body 40 . Wherein, the trolley 20 includes a base 21 and a display panel placement area 22 arranged on the base 21, the base 21 includes a support platform 211 and a boss 212 vertically formed on the upper surface of the support platform 211, and the display panel placement area 22 is arranged on th...
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The embodiment of the invention discloses a high temperature test device. The test device comprises a trolley, a furnace body and a door body. The trolley comprises a base and a display panel placing region arranged on the base. The base comprises a support bench and a protruding bench vertically formed on the upper surface of the support bench. The display panel placing region is arranged on the protruding bench. A power supply supplier and a signal generator are arranged in the support bench. An accommodation cavity for matching and accommodating the trolley is formed in the furnace body. A first thermal insulation plate and a second thermal insulation plate are formed on inner side walls of opposite two sides in the furnace body. A gap through which the protruding bench penetrates is arranged between opposite end parts of the first thermal insulation part and the second thermal insulation part. When the trolley is arranged in the furnace body, the protruding bench is abutted against the first thermal insulation part and the second thermal insulation part simultaneously and is clamped in the gap in a matched manner. The door body is movably arranged on the furnace body and covers the furnace body in a matched manner. According to the invention, a thermal insulation space can be formed so that the power supply supplier and the signal generator are prevented from working in a high temperature environment to shorten the lifetime of the power supply supplier and the signal generator.
Description
technical field [0001] The invention relates to the technical field of display panels, in particular to a high-temperature testing device. Background technique [0002] During the high-temperature test of the display panel, such as the burn-in test, due to the increase in the size of the display panel and the limitation of the length of the power line and signal line, it is no longer possible to meet the requirements of externally placing the power supply and signal generator, that is, the The power supply, the signal generator, and the display panel are subjected to corresponding high-temperature tests. However, a prolonged high temperature environment will reduce the life of the power supply and signal generator. Contents of the invention [0003] An embodiment of the present invention provides a high-temperature testing device, which can form a heat-insulated space to prevent the power supply and the signal generator from operating in a high-temperature environment, th...
Claims
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IPC IPC(8): G01R31/00
CPCG01R31/003G01R31/2875
Inventor 何政航
Owner HKC CORP LTD