Testing electrical connectors and methods of operation

Abstract

The invention discloses a test electrical connector, comprising: an insulating body, which is recessed with a slot and a plurality of receiving slots located on both sides of the slot, each receiving slot communicates with the slot, and each receiving slot has A channel runs through the insulating body downwards, the channel has a first surface and a second surface opposite, the first surface is inclined from top to bottom toward the second surface, a storage space, the storage space communicates with the storage groove; a plurality of terminals , respectively accommodated in a plurality of receiving grooves, each terminal has a connecting portion, a contact portion and a pin extend respectively from the connecting portion, the contact portion is exposed in the slot, the pin is accommodated in the channel, and the pin has an opposite A third surface and a fourth surface, the third surface is inclined from top to bottom toward the fourth surface, there is a gap between the first surface and the third surface; an elastic body is accommodated in the accommodation space, and the elastic body abut against the connecting portion. In the present invention, the pins and the channel are arranged obliquely, so that the terminal can be positioned during the process of inserting and removing the card.

Description

technical field [0001] The invention relates to a testing electrical connector, especially to a testing electrical connector and an operation method thereof. Background technique [0002] At present, after the memory card components of the integrated circuit are manufactured, a burn-in test is required in order to screen out the defective memory card components during the manufacturing process. The burn-in test usually uses the test electrical connector to assemble the memory card components on the test circuit board, turn on the power and increase the temperature of the surrounding environment, so that the defective memory card components will fail as soon as possible, so as to screen them out and avoid Hazardous memory card components are put into use. [0003] The existing test electrical connector mainly includes an insulating body, the insulating body is fixed on a circuit board, a plurality of terminals accommodated in the insulating body and an elastic body abutting ...

AI Technical Summary

Problems solved by technology

[0003] The existing test electrical connector mainly includes an insulating body, the insulating body is fixed on a circuit board, a plurality of terminals accommodated in the insulating body and an elastic body abutting the plurality of terminals, the plurality of terminals and The contact area on the circuit board is in contact, and the insulating body is provided with a slot for inserting and testing the memory card, and the elastic body abuts against the terminal to provide a clamping force for the memory card to ensure The stable connection between the memory card and the test electrical connector, but during the insertion and extraction process of the memory card, the terminal is displaced left and right on the contact area due to the abutment of the elastic body, causing wear to the contact area, making the Test electrical connectors not working properly, costly to replace circuit boards

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