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Height-adjustable testing device for integrated circuit board

A technology of integrated circuit boards and testing devices, which is applied in the direction of electronic circuit testing, measuring devices, and measuring device casings, and can solve problems such as inability to adjust height and inconvenient work

Active Publication Date: 2018-02-13
通元科技(惠州)有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to overcome the disadvantages of being unable to adjust the height and being inconvenient to work in the prior art, the technical problem to be solved by the present invention is to provide a height-adjustable testing device for integrated circuit boards that is convenient for height adjustment and detection by staff

Method used

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  • Height-adjustable testing device for integrated circuit board
  • Height-adjustable testing device for integrated circuit board
  • Height-adjustable testing device for integrated circuit board

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036] A test device with adjustable height for integrated circuit board, such as Figure 1-7 As shown, it includes a bracket 1, a guide rail 2, a guide sleeve 3, a placement mechanism 4, and a rotating mechanism 5. The upper part of the bracket 1 is connected with a guide rail 2, and a guide sleeve 3 is connected to the guide rail 2. The guide rail 2 is matched with the guide sleeve 3, and the guide The right end of the sleeve 3 is connected with a placing mechanism 4, and the lower left side of the bracket 1 is provided with a rotating mechanism 5.

Embodiment 2

[0038] A test device with adjustable height for integrated circuit board, such as Figure 1-7 As shown, it includes a bracket 1, a guide rail 2, a guide sleeve 3, a placement mechanism 4, and a rotating mechanism 5. The upper part of the bracket 1 is connected with a guide rail 2, and a guide sleeve 3 is connected to the guide rail 2. The guide rail 2 is matched with the guide sleeve 3, and the guide The right end of the sleeve 3 is connected with a placing mechanism 4, and the lower left side of the bracket 1 is provided with a rotating mechanism 5.

[0039] The placement mechanism 4 includes a placement plate 41, a pressing rod 42, a first rubber pad 43, a sponge pad 45, a magnet 46, a first support rod 47, and a first spring 48. The left end of the guide sleeve 3 is connected with a placement plate 41. A first support rod 47 is connected to the middle of the left side of 41, and the right end of the first support rod 47 is rotationally symmetrically connected to a pressure rod...

Embodiment 3

[0041] A test device with adjustable height for integrated circuit board, such as Figure 1-7 As shown, it includes a bracket 1, a guide rail 2, a guide sleeve 3, a placement mechanism 4, and a rotating mechanism 5. The upper part of the bracket 1 is connected with a guide rail 2, and a guide sleeve 3 is connected to the guide rail 2. The guide rail 2 is matched with the guide sleeve 3, and the guide The right end of the sleeve 3 is connected with a placing mechanism 4, and the lower left side of the bracket 1 is provided with a rotating mechanism 5.

[0042] The placement mechanism 4 includes a placement plate 41, a pressing rod 42, a first rubber pad 43, a sponge pad 45, a magnet 46, a first support rod 47, and a first spring 48. The left end of the guide sleeve 3 is connected with a placement plate 41. A first support rod 47 is connected to the middle of the left side of 41, and the right end of the first support rod 47 is rotationally symmetrically connected to a pressure rod...

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PUM

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Abstract

The invention relates to a testing device, in particular to a height-adjustable testing device for an integrated circuit board, which aims at providing a height-adjustable testing device for the integrated circuit board with the advantages of convenient height adjusting and convenient detection by a worker. To achieve the aim, the height-adjustable testing device for the integrated circuit board comprises a bracket and the like, wherein the upper part of the bracket is connected with a guide rail; the guide rail is connected with a guide sleeve, and is matched with the guide sleeve; the rightend of the guide sleeve is connected with a placement mechanism; a rotation mechanism is arranged at the left side of the lower part of the bracket. The testing device has the advantages that by arranging the rotation mechanism, the height of a placement plate can be adjusted; by arranging a placement box and the like, the untested and tested integrated circuit boards can be separated; by arranging second slide rails and the like, the number of placed integrated circuit boards can be adjusted.

Description

Technical field [0001] The invention relates to a test device, in particular to a test device with an adjustable height for an integrated circuit board. Background technique [0002] Electronic consumer products have entered an explosive development stage. The demand for integrated circuits such as large-capacity storage integrated circuits, camera integrated circuits, gravity sensing integrated circuits, and central processing units is unprecedentedly large. Integrated circuit testing is an indispensable part of the entire semiconductor manufacturing process. An essential part, the demand for electronic consumer products will surely drive the demand of the IC testing industry. According to different testing purposes, integrated circuit testing can be divided into four types: verification testing, production testing, aging testing, and acceptance testing. [0003] Nowadays, some high-quality integrated circuits only need to simply test the pins, so it is necessary to manually test...

Claims

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Application Information

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IPC IPC(8): G01R1/04G01R31/28
CPCG01R1/0425G01R31/2887
Inventor 杜俊慧黄有为黄东烨
Owner 通元科技(惠州)有限公司