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Height-adjustable test device for integrated circuit board
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A technology of integrated circuit board and test device, which is applied in the direction of electronic circuit test, measurement device, measurement device shell, etc., can solve the problems of inconvenient work and inability to adjust the height, etc.
Active Publication Date: 2020-05-19
通元科技(惠州)有限公司 +1
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Abstract
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Problems solved by technology
[0006] In order to overcome the disadvantages of being unable to adjust the height and being inconvenient to work in the prior art, the technical problem to be solved by the present invention is to provide a height-adjustable testing device for integrated circuit boards that is convenient for height adjustment and detection by staff
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Embodiment 1
[0036] A height-adjustable test device for integrated circuit boards, such as Figure 1-7 As shown, it includes a bracket 1, a guide rail 2, a guide sleeve 3, a placement mechanism 4, and a rotation mechanism 5. The upper part of the bracket 1 is connected with a guide rail 2, and the guide rail 2 is connected with a guide sleeve 3, and the guide rail 2 cooperates with the guide sleeve 3. The right end of cover 3 is connected with placing mechanism 4, and the bottom left side of support 1 is provided with rotating mechanism 5.
Embodiment 2
[0038] A height-adjustable test device for integrated circuit boards, such as Figure 1-7 As shown, it includes a bracket 1, a guide rail 2, a guide sleeve 3, a placement mechanism 4, and a rotation mechanism 5. The upper part of the bracket 1 is connected with a guide rail 2, and the guide rail 2 is connected with a guide sleeve 3, and the guide rail 2 cooperates with the guide sleeve 3. The right end of cover 3 is connected with placing mechanism 4, and the bottom left side of support 1 is provided with rotating mechanism 5.
[0039] Placement mechanism 4 includes placement plate 41, depression bar 42, first rubber pad 43, sponge pad 45, magnet 46, first pole 47 and first spring 48, and the left end of guide sleeve 3 is connected with placement plate 41, placement plate The left middle part of 41 is connected with the first strut 47, and the right end of the first strut 47 is rotationally symmetrically connected with the pressure bar 42, and the inner side of the pressure ba...
Embodiment 3
[0041] A height-adjustable test device for integrated circuit boards, such as Figure 1-7 As shown, it includes a bracket 1, a guide rail 2, a guide sleeve 3, a placement mechanism 4, and a rotation mechanism 5. The upper part of the bracket 1 is connected with a guide rail 2, and the guide rail 2 is connected with a guide sleeve 3, and the guide rail 2 cooperates with the guide sleeve 3. The right end of cover 3 is connected with placing mechanism 4, and the bottom left side of support 1 is provided with rotating mechanism 5.
[0042] Placement mechanism 4 includes placement plate 41, depression bar 42, first rubber pad 43, sponge pad 45, magnet 46, first pole 47 and first spring 48, and the left end of guide sleeve 3 is connected with placement plate 41, placement plate The left middle part of 41 is connected with the first strut 47, and the right end of the first strut 47 is rotationally symmetrically connected with the pressure bar 42, and the inner side of the pressure ba...
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Abstract
The invention relates to a testing device, in particular to a height-adjustable testing device for an integrated circuit board, which aims at providing a height-adjustable testing device for the integrated circuit board with the advantages of convenient height adjusting and convenient detection by a worker. To achieve the aim, the height-adjustable testing device for the integrated circuit board comprises a bracket and the like, wherein the upper part of the bracket is connected with a guide rail; the guide rail is connected with a guide sleeve, and is matched with the guide sleeve; the rightend of the guide sleeve is connected with a placement mechanism; a rotation mechanism is arranged at the left side of the lower part of the bracket. The testing device has the advantages that by arranging the rotation mechanism, the height of a placement plate can be adjusted; by arranging a placement box and the like, the untested and tested integrated circuit boards can be separated; by arranging second slide rails and the like, the number of placed integrated circuit boards can be adjusted.
Description
technical field [0001] The invention relates to a testing device, in particular to a height-adjustable testing device for an integrated circuit board. Background technique [0002] Electronic consumer products have entered an explosive development stage. The demand for integrated circuits such as large-capacity storage integrated circuits, camera integrated circuits, gravity sensing integrated circuits, and central processing units is unprecedentedly large. Integrated circuit testing is an indispensable part of the entire semiconductor manufacturing process. An indispensable link, the demand for electronic consumer products will definitely drive the demand for the integrated circuit testing industry. According to the purpose of testing, integrated circuit testing can be divided into four types: verification testing, production testing, burn-in testing, and acceptance testing. [0003] Some high-quality integrated circuits now only need to simply test the pins, so it is nece...
Claims
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Application Information
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