Nondestructive testing method for ultra-precision machining sub-surface damage of optical crystal
A technology of subsurface damage and ultra-precision machining, which is used in material analysis using radiation diffraction to achieve accurate and reliable detection results, high resolution, and high detection accuracy.
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specific Embodiment approach 1
[0017] Embodiment 1: A non-destructive detection method for subsurface damage in ultra-precision machining of optical crystals. The specific process is as follows:
[0018] combine figure 1 This embodiment will be described. The detection method described in this embodiment is implemented based on the X-ray source 1 , the X-ray detector 3 , and the movable sample stage 4 . The X-ray source 1 can be adjusted in angular position along a circle with the center of the irradiation area as the center, so that the quasi-parallel X-rays generated by it can be incident on the surface of the sample 2 at a certain angle ω. The included angle ω between the incident X-ray and the surface of the sample 2 can be as low as the critical angle of total reflection, and the smaller the included angle, the smaller the detection depth. The sample 3 is placed on a sample stage 4 that can move along the X and Y directions and rotate along the n direction (normal direction of the surface of the test...
specific Embodiment approach 2
[0024] Specific implementation mode two: combination figure 1 This embodiment is described. The difference between this embodiment and the first embodiment is that the quasi-parallel X-rays and diffracted X-rays generated by the X-ray source and the surface normal of the optical crystal to be detected are located in the same plane.
[0025] Other steps and parameters are the same as those in Embodiment 1.
specific Embodiment approach 3
[0026] Specific implementation mode three: combination figure 1 This embodiment is described. The difference between this embodiment and the specific embodiment 1 or 2 is that the X-ray sources are generated by different targets and generate X-rays of different wavelengths to meet the needs of different optical crystal surface or subsurface damage detection. ;
[0027] The target material is metal tungsten, copper, cobalt, nickel, iron, silver, palladium, molybdenum or palladium.
[0028] Other steps and parameters are the same as those in Embodiment 1 or Embodiment 2.
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