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Preparation method of high refractive index hydrogenated silicon film, high refractive index hydrogenated silicon film, filter stack and filter

一种高折射率、氢化硅的技术,应用在高折射率氢化硅薄膜的制备,高折射率氢化硅薄膜,滤光叠层和滤光片领域,能够解决靶材中毒、生产不稳定、生产效率低等问题,达到信噪比高、避免中毒问题、信号损失少的效果

Active Publication Date: 2018-10-30
ZHEJIANG CRYSTAL OPTECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this technology adopts the principle of reactive sputtering, and there may be "poisoning" of the target material, that is, the target material is easily polluted by hydrogen gas, resulting in unstable production and other problems.
[0005] In order to produce a filter with low polarization effect, it is difficult for general sputtering equipment to prepare silicon hydrogenated silicon with a high refractive index of more than 2.5 and an extinction coefficient lower than 0.0005, and complex and special coating equipment must be used
However, the production efficiency of the coating machine made by the existing technology is low, which causes the cost of a single chip to remain high.

Method used

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  • Preparation method of high refractive index hydrogenated silicon film, high refractive index hydrogenated silicon film, filter stack and filter
  • Preparation method of high refractive index hydrogenated silicon film, high refractive index hydrogenated silicon film, filter stack and filter
  • Preparation method of high refractive index hydrogenated silicon film, high refractive index hydrogenated silicon film, filter stack and filter

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preparation example Construction

[0055] According to a first aspect of the present invention, a method for preparing a high refractive index hydrogenated silicon film is provided, comprising the following steps:

[0056] (a) Deposit Si on the substrate by magnetron Si target sputtering to form a silicon film;

[0057] (b) The silicon film forms an oxygen-containing hydrogenated silicon film in an environment containing active hydrogen and active oxygen, and the amount of active oxygen accounts for 4 to 99% of the total amount of active hydrogen and active oxygen, or,

[0058] The silicon film forms a hydrogenated silicon film containing nitrogen in an environment containing active hydrogen and active nitrogen, and the amount of active nitrogen accounts for 5-20% of the total amount of active hydrogen and active nitrogen.

[0059] In step (a), the Si target is a semiconductor high-purity silicon material in the form of single crystal or polycrystal.

[0060] Typical but non-limiting substrates are, for exampl...

Embodiment 1

[0142] A method for preparing a high-refractive-index hydrogenated silicon film comprising the following steps:

[0143] (a) The clean substrate is placed on the roller with the coated side facing outward;

[0144] (b) The drum rotates at a constant speed in the coating chamber;

[0145] (c) When the vacuum degree is higher than 10 -4 At Pa, turn on the sputtering source and pass argon gas, the power of the sputtering source is 8KW, the argon gas is ionized to form plasma, and bombards the high-purity silicon target under the action of electricity and magnetic field, and the silicon material is sputtered onto the substrate;

[0146] (d) With the rotation of the drum, the substrate is brought to the reaction source area;

[0147] (e) Turn on the reaction source, the power of the reaction source is 2KW, hydrogen, oxygen and argon are fed into the reaction source area, and the gas flow rate is adjusted so that the volume percentage of the incoming oxygen accounted for the sum o...

Embodiment 2

[0149] A method for preparing a high-refractive-index oxygen-containing hydrogenated silicon film. In step (e), the volume percentage of the oxygen fed into the sum of the hydrogen and oxygen fed is 14%, and the rest of the steps and parameters are the same as in Example 1.

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Abstract

The invention discloses a preparation method of a high refractive index hydrogenated silicon film, a high refractive index hydrogenated silicon film, a filter stack and a filter, and relates to the technical field of optical films. This includes the following steps: (a) deposit Si on the substrate through magnetron Si target sputtering to form a silicon film; (b) the silicon film forms an oxygen-containing hydrogenated silicon film in an environment containing active hydrogen and active oxygen. The amount of oxygen accounts for 4 to 99% of the total amount of active hydrogen and active oxygen, or the silicon film forms a nitrogen-containing hydrogenated silicon film in an environment containing active hydrogen and active nitrogen, and the amount of active nitrogen accounts for the total amount of active hydrogen and active nitrogen. 5~20% of the quantity. The present invention separates sputtering and reaction. First, Si is deposited on the substrate through magnetron Si target sputtering, and then the plasma of active hydrogen and active oxygen / nitrogen reacts with silicon to obtain oxygen- or nitrogen-containing SiH. The problem of target poisoning is avoided, and the SiH film has a higher refractive index and lower absorption.

Description

technical field [0001] The invention relates to the technical field of optical thin films, in particular to a method for preparing a high-refractive-index hydrogenated silicon film, a high-refractive-index hydrogenated silicon film, a filter stack and an optical filter. Background technique [0002] Silicon hydrogenated thin films have attracted much attention due to their wide application prospects in microelectronic devices such as infrared imaging sensors, solar cells and thin film transistors. The preparation process of silicon hydride is mainly divided into chemical deposition methods, such as plasma enhanced chemical vapor deposition, etc.; physical deposition methods, such as radio frequency sputtering. [0003] In near-infrared imaging systems such as 3D, a narrow-band bandpass filter is used, which requires that even if the light is incident at a large angle, the offset of its central wavelength with the angle should be as small as possible, so as to ensure a wider ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C23C14/14C23C14/35C23C14/58G02B1/10G02B5/28
CPCG02B1/10G02B5/285C23C14/14C23C14/35C23C14/5826C23C14/5846C03C17/36C03C17/3636C03C17/3657C03C17/3678C03C17/22C03C2217/28C03C2218/155C03C2218/156C03C2218/31C03C2218/32C03C2217/734C03C17/3649C23C14/10C23C14/5853C23C14/0078C23C14/0036C23C14/5806G02B5/20C03C17/245C03C2217/213C03C2217/70C03C2218/154C23C14/0068C23C14/505C23C14/022
Inventor 张睿智唐健王迎余辉陆张武徐征驰张启斌
Owner ZHEJIANG CRYSTAL OPTECH