A Beam Attitude Adjustment Method for Scanning Interference Field Exposure System
An exposure system and scanning interference technology, applied in the field of beam attitude adjustment at the macro and micro levels, can solve the problems of affecting the quality of grating masks, quality deterioration, affecting the uniformity of the mask, etc., and achieve scanning interference field exposure technology and The effect of improving the technological level and ensuring the accuracy and stability
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[0020] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0021] Please see figure 1 , is a beam attitude adjustment method for a scanning interference field exposure system of the present invention, which includes: a light source laser 1, a beam macro adjustment module I and a beam micro adjustment module II.
[0022] Please see figure 1 , the beam micro-adjustment module II is used for...
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