Testing device for integrated circuit board

A technology for an integrated circuit board and a testing device, applied in the field of testing devices for integrated circuit boards, can solve problems such as shortening the design and processing cycle of a test fixture, and achieve the effects of shortening the development cycle, saving design, and improving efficiency

Inactive Publication Date: 2018-05-18
GOERTEK INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Considering the commonality of integrated circuit board testing, it is necessary to design a device for testing integrated circuit boards i

Method used

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  • Testing device for integrated circuit board
  • Testing device for integrated circuit board

Examples

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Example Embodiment

[0024] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that unless specifically stated otherwise, the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention.

[0025] The following description of at least one exemplary embodiment is actually only illustrative, and in no way serves as any limitation to the present invention and its application or use.

[0026] The technologies, methods, and equipment known to those of ordinary skill in the relevant fields may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be regarded as part of the specification.

[0027] In all examples shown and discussed herein, any specific value should be interpreted as merely exemplary, rather than as a limitation. Therefore, other examples of th...

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Abstract

The invention discloses a testing device for an integrated circuit board. The testing device for the integrated circuit board comprises a first supporting piece, a sliding carrier board slidably connected to the first supporting piece, a to-be-tested product carrier board detachably installed on the sliding carrier board, a first driving assembly, a second driving assembly, a connecting piece connected to the second driving assembly, and a testing board detachably installed on the connecting piece, wherein the first driving assembly is configured to drive the sliding carrier board to move to atesting position, the testing board is provided with a testing probe, and the second driving assembly is configured to drive the connecting piece to move towards the to-be-tested product carrier board and make the testing probe make contact with a contact on the to-be-tested circuit board after the sliding carrier board moves to the testing position. The testing device solves the technical problem that a testing device for testing integrated circuit boards of different electronic products has no universality.

Description

Technical field [0001] The present invention relates to the technical field of product testing. More specifically, the present invention relates to a testing device for integrated circuit boards. Background technique [0002] With more and more types of consumer electronic products, the update speed is getting faster and faster. Products such as mobile phones, game consoles, VR (virtual reality), etc., test fixtures and other equipment customized for electronic products will also appear due to products A phenomenon that can't be reused after generation. [0003] In different types of electronic products, the structure of the integrated circuit board is roughly similar, and even the size of the integrated circuit board is similar. In the prior art, test devices for testing integrated circuit boards of different electronic products are designed and processed separately, which is not yet universal, which increases the design and processing cycle of test fixtures. [0004] In the test ...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 张刚
Owner GOERTEK INC
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