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Strain sensor and strain quantity measuring method

A deformation sensor and measurement method technology, applied in the direction of instruments, measuring forces, measuring devices, etc., can solve the problems of increased thickness and large-scale

Inactive Publication Date: 2018-07-03
KONICA MINOLTA INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the case where the reflected light intensity is sufficiently ensured, it is necessary to set the particle layer in the thickness direction to several tens to hundreds of cycles, so there is a problem that the thickness increases and the size increases.

Method used

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  • Strain sensor and strain quantity measuring method

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Deformed example 1

[0076] For example, in the above-mentioned embodiment, the marking member 3 is fixed on the upper surface of the fixing member W1 arranged below the light source 2 in the Z direction, but the present invention is not limited thereto. For example, if Figure 6 As shown, it is also possible not to fix the marking member 3 on the fixing member W1, but set the marking member 3 from the outer peripheral portion (for example, Figure 6 In the example shown, it is a structure in which both sides in the Y direction) are held.

Deformed example 2

[0078] In addition, in the above-mentioned embodiment, the configuration in which the light beams 21 to 23 emitted from the light source 2 are reflected by the marking member 3 has been illustrated and described, but the configuration is not limited thereto. For example, a configuration may be adopted in which the light beams 21 to 23 emitted from the light source 2 pass through the marking member 3 . In this case, if Figure 7 As shown in , the detection unit 4 is arranged in front of the light beams 21 - 23 emitted from the light source part 2 passing through the marking part 3 , and detects the spectral intensity of the light transmitted by the marking part 3 . In addition, in the case of the configuration of the embodiment, by also configuring the fixing member W1 with a transparent body, it is possible to have a configuration in which the light beams 21 to 23 pass through the marking member 3 and the fixing member W1.

[0079] As described above, by constituting the stra...

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Abstract

The invention provides a strain sensor and a strain quantity measuring method. The strain sensor includes a marker for regularly and periodically arranging particles generating surface plasmon in a direction orthogonal to a light receiving surface of a strain body with strain due to a load and in a first direction parallel to an in-plane direction of the light receiving surface, a light source foremitting light to the marker, a first detector for detecting a spectrum intensity of the light reflected by the marker, a second detector for detecting a peak of an absorption spectrum of the light reflected by the marker based on the spectrum intensity detected by the first detector, and a calculator for calculating the strain quantity in the direction orthogonal to the light receiving surface based on the peak of the absorption spectrum detected by the second detector. In addition, the strain body is formed by a transparent body, and the diameter of the particles is below the wavelength ofthe light irradiated to the marker.

Description

technical field [0001] The invention relates to a deformation sensor and a deformation measurement method. Background technique [0002] In recent years, there has been an increasing need to visualize various physical quantities (such as displacement, load, acceleration, etc.) acting on the object to be measured. As one of the techniques for meeting the above-mentioned needs, there is known a technique using a structural color changing material whose color tone changes according to the strain (for example, refer to JP-A-2006-28202). This material can change the color tone and deformation according to the three-dimensional regular arrangement of nano-sized monodisperse particles in a rubber-like elastomer (elastomer). More specifically, by changing the spacing of lattice planes formed by particles (dielectric) according to the amount of deformation in the out-of-plane direction of the material, the wavelength 位 of Bragg reflection is shifted, thereby changing the color tone ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/16G01L1/24
CPCG01B11/168G01L1/24G01L1/247G01L1/2293G01B11/161
Inventor 妞嶆潙鑻辩敓姹犵敯鍜屾爲
Owner KONICA MINOLTA INC