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An infrared temperature measurement method, system and terminal equipment

A technology of infrared temperature measurement and equipment under test, which is applied in the field of infrared detection and can solve the problem of not being able to detect the location of the highest temperature of the equipment

Active Publication Date: 2020-03-31
SHENZHEN LAUNCH DIGITAL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of this, the embodiment of the present invention provides an infrared temperature measurement method, system and terminal equipment to solve the problem that the infrared temperature measurement method in the prior art cannot detect the position of the highest temperature of the device

Method used

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  • An infrared temperature measurement method, system and terminal equipment
  • An infrared temperature measurement method, system and terminal equipment
  • An infrared temperature measurement method, system and terminal equipment

Examples

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Embodiment 1

[0026] figure 1 It shows the implementation flow chart of an infrared temperature measurement method provided by Embodiment 1 of the present invention, and is described in detail as follows:

[0027] Step S11, acquiring an infrared image of the device under test, and identifying a device outline of the device under test in the infrared image;

[0028] In the embodiment of the present invention, for the equipment that needs to detect the temperature, the infrared image of the equipment to be tested is firstly acquired. When acquiring the infrared image, the inspection robot first runs to the target position, and then according to the Adjust the angle of the pan / tilt according to the positional relationship. After the angle of the pan / tilt is adjusted to the point where the inspection robot can scan a clear infrared image of the device to be tested, it starts scanning the device to be tested and obtains the infrared image of the device to be tested. Since the original component...

Embodiment 2

[0061] Corresponding to the infrared temperature measurement method described in the above examples, Figure 6 A structural block diagram of an apparatus provided by an embodiment of the present invention is shown, and for ease of description, only parts related to the embodiment of the present invention are shown.

[0062] refer to Figure 6 , the infrared temperature measurement system includes: an equipment profile recognition unit 61, a detection reference line determination unit 62, and a maximum temperature detection unit 63; wherein:

[0063] A device profile recognition unit 61, configured to acquire an infrared image of the device under test, and identify the device profile of the device under test in the infrared image;

[0064] In the embodiment of the present invention, for the equipment that needs to detect the temperature, first obtain the infrared image of the equipment under test. Adjust the angle of the pan / tilt according to the positional relationship. Afte...

Embodiment 3

[0096] Figure 7 It is a schematic diagram of a terminal device provided by an embodiment of the present invention. Such as Figure 7 As shown, the terminal device 7 of this embodiment includes: a processor 70 , a memory 71 and a computer program 72 stored in the memory 71 and operable on the processor 70 . When the processor 70 executes the computer program 72, the steps in the above-mentioned embodiments of the infrared temperature measurement method are realized, for example figure 1 Steps S11 to S13 are shown. Alternatively, when the processor 70 executes the computer program 72, it realizes the functions of the modules / units in the above-mentioned device embodiments, for example Figure 6 Function of units 61 to 63 shown.

[0097] Exemplarily, the computer program 72 can be divided into one or more modules / units, and the one or more modules / units are stored in the memory 71 and executed by the processor 70 to complete this invention. The one or more modules / units ma...

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Abstract

The present invention is suitable for the technical field of infrared detection, and provides an infrared temperature measurement method and system and a terminal device. The method comprises the steps of: obtaining an infrared image of a device to be measured, and identifying the device outline of the device to be measured in the infrared image; according to the device outline, determining a detection reference line of the device to be measured; and obtaining the highest temperature of the device to be measured and position information corresponding to the highest temperature through the detection reference line. In the process, when the device to be measured is detected according to the detection reference line, the temperature of each position of the device to be measured is detected, and the detected highest temperature is determined according to a whole detection result so as to avoid the condition that the highest temperature is not in a preset temperature measurement area when the temperature of the device to be measured is detected and improve the detection accuracy.

Description

technical field [0001] The invention belongs to the technical field of infrared detection, and in particular relates to an infrared temperature measurement method, system and terminal equipment. Background technique [0002] Infrared temperature measurement and diagnosis technology is a high-tech technology for diagnosing heating defects of electrical equipment. It can detect, deal with and prevent major accidents in time, and plays a unique role in ensuring the safe and stable operation of the power grid. In substation temperature measurement technology, in addition to traditional manual temperature measurement, with the improvement of modern infrared technology and the wide application of substation inspection robots in the power industry, infrared temperature measurement technology has also been effectively extended and developed in robot systems. When the temperature measurement inspection of the equipment is carried out by the intelligent inspection robot, all operation...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/52
CPCG01J5/52
Inventor 杨莉君
Owner SHENZHEN LAUNCH DIGITAL TECH