Microwave millimeter wave three-dimensional near-field data acquisition and imaging system

Abstract

The invention relates to a microwave millimeter wave three-dimensional near-field data acquisition and imaging system, and belongs to the field of electromagnetic field measurement technology. The system is provided with a control computer, a test probe, a three-axis motion controller, a linear translation stage, a vector network analyzer, a metal bracket, and a sample stage, wherein the control computer is respectively connected to a three-axis motion controller and a vector network analyzer; the three-axis motion controller is connected to the linear translation stage; the sample stage is mounted on the linear translation stage; the metal bracket is arranged above the linear translation stage; the test probe is fixed on the metal bracket and connected to the vector network analyzer alongwith a port of the tested sample. A high-performance long-stroke linear motion platform and a coaxial test probe can be used to scan an electric field or magnetic field one by one at different frequencies in a specified area around the tested sample to obtain relevant amplitude and phase information data, and can analyze, process and display a field distribution data through a computer.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic field measurement, in particular to a microwave and millimeter wave three-dimensional near-field data acquisition and imaging system. Background technique [0002] Electromagnetic metamaterials are composite materials with periodic or quasi-periodic structures artificially designed. Compared with traditional materials, this composite material has specific physical properties, and this specific physical property depends not only on the intrinsic properties of the constituent materials, but also on its subwavelength structural size parameters. Studies have shown that electromagnetic metamaterials have a variety of novel physical properties such as negative refractive index, superabsorption, optical rotation, and electromagnetic induction-like transparency, and these properties can be regulated by structural size design. In recent years, in order to facilitate the integration and application...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to overcome the problems in the existing near-field scanning technology such as low precision, complex construction, single measurement mode, and only one scan can obtain the field distribution of a single frequency, and provide a solution suitable for open waveguides, integrated circuits, metamaterials, ultra- Microwave and millimeter wave three-dimensional near-field data acquisition and imaging system for surfaces and other devices and circuits

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