Method and system for testing leakage current of light-emitting diode (LED)
A technology of light-emitting diodes and testing systems, which is applied in the direction of diode testing, current-only testing, and dielectric strength testing. It can solve problems such as low testing accuracy and large temperature fluctuations in the testing environment, and achieve the goal of improving testing accuracy and leakage current testing. Effect
Inactive Publication Date: 2019-01-04
上海卓弘微系统科技有限公司
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Problems solved by technology
[0005] However, due to the large fluctuations in the test environment temperature in the existing light-emitting diode leakage current test scheme, the test accuracy of the existing light-emitting diode test scheme is low
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[0016] The LED leakage current testing system provided in this embodiment includes a constant temperature device, a controller and a TLP test device; wherein the controller is connected to the constant temperature device for setting the constant temperature in the constant temperature device; the TLP test device is connected to The constant temperature device and the controller are used for testing the leakage current of the light-emitting diodes that need to be placed in the constant temperature device, and sending the test results to the controller. The constant temperature device may be a constant temperature box, and the controller may be a computer.
[0017] Optionally, the controller includes a temperature adjustment module, which is used to adjust the temperature value in the thermostat. The test results may include the LED leakage current test results when the thermostat is at different constant temperatures. The test results may also include different LED leakage curr...
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The invention discloses a detection scheme which can realize temperature control and integrate LED leakage current and antistatic capability test. According to the present invention, a TLP test systemis used for measuring leakage current; a control box of a constant temperature blasting and drying box is used for realizing temperature control adjustment; and simultaneously, possible influences ofhumidity in air on static test results are eliminated. By means of the method of the present invention, a TLP model is used for measuring leakage current passing through the LED under various temperatures, so as to reflect the quality of an LED chip; and rectangular short pulses with continuously adjustable amplitudes can be generated for detecting the antistatic ability of the LED chip, so as toillustrate that some potential failure mechanisms may exist in the device.
Description
technical field [0001] The invention belongs to the field of semiconductors, and in particular relates to a light emitting diode (light emitting diode) leakage current testing method and system. Background technique [0002] With the development of microelectronics manufacturing level, light-emitting diodes have become a light source product with a wide range of uses in recent years, and their application range has continued to expand. Lighting, display, medical and other fields have put forward strict requirements on the performance of light-emitting diodes under various environmental conditions. [0003] As an important parameter affecting the performance of light-emitting diode devices, the leakage current of light-emitting diodes has attracted more and more attention. The leakage current of a light-emitting diode is generally defined as a tiny current measured under a reverse voltage of -5V applied to both poles of the light-emitting diode. At this time, the light-emitt...
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IPC IPC(8): G01R31/26G01R31/12G01R19/00
CPCG01R31/2635G01R19/0092G01R31/129
Inventor 陆宇
Owner 上海卓弘微系统科技有限公司