A Leakage Current Calculation Method for Thyristor Out-of-Band Circuits for Voltage Resistance Test
A calculation method and external circuit technology, applied in the direction of testing dielectric strength, measuring current/voltage, single semiconductor device testing, etc., can solve problems such as long detection time, equipment damage, loose screws, etc., and achieve the effect of increasing practicability
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[0033] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0034] For the traditional thyristor forward withstand voltage performance test, the test circuit diagram is based on the requirements of the national standard "GB-T15291-2015 Semiconductor Devices Part 6: Thyristors" as follows image 3 As shown, B in the figure is the gate circuit; D1 and D2 are diodes that provide the positive half cycle, which are only used to measure the off-state characteristics of the thyristor; G is the AC voltage source; R1 is the protection resistor; R2 is the calibrated current Measure a non-inductive resistor; T is the thyristor under test; OSC is an oscilloscope or a peak reading instrument. The test method is to measure the leakage current of the thyristor T under the specified voltage condition. Th...
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