Semiconductor package device and method of manufacturing the same
一种封装装置、半导体的技术,应用在半导体/固态器件制造、半导体器件、半导体/固态器件零部件等方向,能够解决易于开裂、错误焊接等问题
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[0026] Figure 1A A cross-sectional view of a semiconductor package device 1 according to some embodiments of the present disclosure is illustrated. The semiconductor package 1 comprises a passivation layer 10 , a dielectric layer 11 , an electronic component 12 , a package body 13 , an interconnect structure 14 (also referred to as a conductive element) and an electrical contact 15 .
[0027] The passivation layer 10 has a top surface 101 (also referred to as a first surface) and a bottom surface 102 (also referred to as a second surface) opposite the top surface. In some embodiments, passivation layer 10 comprises silicon oxide, silicon nitride, gallium oxide, aluminum oxide, scandium oxide, zirconium oxide, lanthanum oxide, hafnium oxide, another oxide, another nitride, or both. combination of one or more than two. In some embodiments, passivation layer 10 may be replaced with a solder resist liquid (eg, in the form of ink) or a film, depending on the specifications of var...
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