Detection method for rapidly predicting wheat baking quality
A detection method, wheat technology, applied in the direction of measuring devices, material analysis through optical means, instruments, etc., can solve the problems of small number of detection samples and slow detection speed, so as to speed up the acquisition speed, promote the automation process, and promote energy saving and reduction. consumption effect
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[0019] A detection method for rapidly predicting the baking quality of wheat, comprising the steps of:
[0020] (1) Sample selection:
[0021] A total of 321 samples of wheat were selected from nationwide surveys in 2016 and 2017, including different wheats from different planting areas in Jining City and its surrounding areas, Anhui, northern Jiangsu, and eastern Henan.
[0022] (2) Sample Spectrum Collection
[0023] After cleaning and mixing 321 wheat samples, put them into the sample tray, scan each sample twice, and take the average value of the spectrum. The original spectrum of the sample, such as figure 1 shown;
[0024] Near-infrared spectrum collection method: Under the condition of room temperature 25°±1°, use a near-infrared spectrometer to collect a total of 800 spectral points in the near-infrared spectral range of wavelength 1000-1800nm, and collect the intensity of reflected light every 1nm; The sample was scanned repeatedly in the near-infrared spectromete...
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