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Detection method for rapidly predicting wheat baking quality

A detection method, wheat technology, applied in the direction of measuring devices, material analysis through optical means, instruments, etc., can solve the problems of small number of detection samples and slow detection speed, so as to speed up the acquisition speed, promote the automation process, and promote energy saving and reduction. consumption effect

Inactive Publication Date: 2019-04-05
益海嘉里(兖州)粮油工业有限公司
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  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a detection method for quickly predicting the baking quality of wheat, which overcomes the shortcomings of slow detection speed and small number of detection samples in the traditional wheat baking quality judgment in the aforementioned prior art

Method used

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  • Detection method for rapidly predicting wheat baking quality
  • Detection method for rapidly predicting wheat baking quality
  • Detection method for rapidly predicting wheat baking quality

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Embodiment 1

[0019] A detection method for rapidly predicting the baking quality of wheat, comprising the steps of:

[0020] (1) Sample selection:

[0021] A total of 321 samples of wheat were selected from nationwide surveys in 2016 and 2017, including different wheats from different planting areas in Jining City and its surrounding areas, Anhui, northern Jiangsu, and eastern Henan.

[0022] (2) Sample Spectrum Collection

[0023] After cleaning and mixing 321 wheat samples, put them into the sample tray, scan each sample twice, and take the average value of the spectrum. The original spectrum of the sample, such as figure 1 shown;

[0024] Near-infrared spectrum collection method: Under the condition of room temperature 25°±1°, use a near-infrared spectrometer to collect a total of 800 spectral points in the near-infrared spectral range of wavelength 1000-1800nm, and collect the intensity of reflected light every 1nm; The sample was scanned repeatedly in the near-infrared spectromete...

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Abstract

The invention relates to the technical field of wheat quality detection, in particular to a detection method for rapidly predicting wheat baking quality. The detection method for rapidly predicting wheat baking quality comprises the following steps of: collection of wheat samples, acquisition of wheat sample spectrums, pretreatment of spectrum data, national standard method-based detection of wheat baking effect, selection of correction set and prediction set samples, establishment and screening of baking quality prediction models, and wheat detection and analysis. According to the detection method for rapidly predicting wheat baking quality, a near-infrared spectrograph is utilized to carry out scanning so as to obtain spectrograms of wheats, and spectral information is processed throughdifferent preprocessing methods to obtain a near-infrared correction model for determining wheat baking effect bread heights; in practical operations, the wheats are scanned through the new-infrared spectrograph to obtain height numerical values of wheat baking breads, so that the wheat baking quality is predicted; and the method has the characteristics of being lossless, green, efficient and correct, and is capable of realizing judgement of wheat baking quality in 2 s.

Description

technical field [0001] The invention relates to the technical field of wheat quality detection, in particular to a detection method for rapidly predicting the baking quality of wheat. Background technique [0002] The determination of the baking quality of high-quality wheat (bread wheat) is based on the results of laboratory baking tests. The height value of the bread made from wheat samples is the most important indicator for judging the baking quality of wheat (height of bread less than 17.0cm cannot be regarded as high-quality bread). wheat use). Laboratory testing of wheat baking quality requires the next day to obtain test results according to the traditional method. It takes about 16-18 hours from wheat sample sampling, cleaning, wheat tempering, flour milling to making bread. The detection takes a long time and is limited by the detection workload. Generally, a maximum of a dozen wheat samples can be detected in one day. The traditional determination of wheat baki...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3563G01N21/359
CPCG01N21/3563G01N21/359
Inventor 王继进耿丽娜
Owner 益海嘉里(兖州)粮油工业有限公司