A Method for Measuring Aircraft Skin Gap and Step Difference Based on Parallel Line Structured Light
A technology of structured light and parallel lines, applied in the field of image processing, can solve the problems of narrow application range, gap and step measurement, and high measurement error, and achieve the effect of wide application range, low measurement error and simple operation.
Active Publication Date: 2021-03-05
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
View PDF12 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0006] The purpose of the present invention is to solve the problem of narrow application range and high measurement error in the existing dual structured light measurement, and can only solve the problem of measuring the gap and step difference of planar parts, and to invent a method suitable for curved skins and chamfered skins. The aircraft skin gap and step difference measurement method based on parallel line structured light based on skin-to-slit measurement, which not only broadens the application range of the dual structured light measurement model, but also improves the measurement accuracy
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0036] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.
[0037] like Figure 1-8 shown.
[0038] A method for measuring aircraft skin gaps and steps based on parallel line structured light, comprising the following steps:
[0039] (1) Calibration of structured light measurement system:
[0040] (1-1) Fix the position of the camera, the parallel line structured light emitter and the calibration plate, and collect the image of the calibration plate ( figure 1 ), extract the corner point image of the calibration board, and the corner points form two pairs of mutually orthogonal and three mutually parallel straight lines;
[0041] (1-2) Turn on the parallel line structured light emitter, project the structured light stripes on the calibration plate, extract the center of the structured light stripes, and calculate the intersection coordinates of the three parallel lines and the center line o...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses an aircraft skin clearance and scale measurement method based on parallel line structured light. The method is characterized by comprising the following steps: 1) calibrating acamera internal parameter and a structured light plane parameter; 3) enabling a camera to collecting a structured light image, and extracting clearance scale feature point of the aircraft skin in thestructured light stripe image, and recording the feature point 8-neighborhood gray information; 3) converting the feature point two-dimensional coordinate into a three-dimensional coordinate by usinga camera calibration result and a structured light plane calibration result; and 4) computing the clearance and scale value by using different methods according to the clearance and scale feature point 8-neighborhood gray information. The measurement method disclosed by the invention has the advantages as follows: 1) adopting a new calibration board to realize the synchronous calibration of the camera and the structured light plane, and improving the structured light measurement system calibration efficiency; and 2) considering the structured light stripe local geometric feature when computing the clearance and scale, improving the applicable range of the line structured light measurement system, and reducing the measurement error when being applied to the complex contour clearance scale.
Description
technical field [0001] The invention relates to an image processing technology, in particular to a two-dimensional image processing or three-dimensional graphic generation technology, in particular to a method for measuring aircraft skin gap and step difference based on parallel line structured light. Background technique [0002] In aircraft assembly-related processes, skin to seam (step difference and gap formed between aircraft outer surface skin and skin, skin and structure, flap and structure, etc.) has a significant impact on the aerodynamic performance and stealth performance of the aircraft. Direct impact, so control and testing are required during assembly. [0003] As the requirements for the aerodynamic performance of the aircraft become higher and higher, the requirements for the gap and step difference between the skin joints also increase. Taking the aircraft skin as an example, the gap between seams and the accuracy of the step difference are usually about 0....
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/14G01B11/00
CPCG01B11/002G01B11/14
Inventor 黄翔李泷杲李根
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS