Display device and repair and detection method thereof

Abstract

The invention provides a display device and a repair and detection method thereof. The display device comprises a plurality of thin film transistors, wherein each thin film transistor is provided witha grid electrode, a source electrode and a drain electrode; a plurality of data lines respectively coupled to the drain electrode or source electrode of the thin film transistor; a common electrode corresponding to at least one of the thin film transistors; and a repair detection circuit which comprises a first detection pad which is provided with a first detection metal pad and a first detectionmetal wire, wherein the first detection metal wire is electrically connected with the first detection metal pad; a second detection pad provided with a second detection metal pad and a second detection metal wire, wherein the second detection metal wire is electrically connected with the second detection metal pad; the first detection metal line and the second detection metal line have an overlapping area and are electrically connected in the overlapping area. Laser energy can be adjusted in real time to ensure the repair success rate.

Description

technical field [0001] The present invention relates to a display device, and in particular to a display device including a repair detection circuit and a repair detection method thereof. Background technique [0002] With the development of technology, display devices are widely used in many electronic products, such as mobile phones, tablet computers, watches and so on. In order to improve display quality, large-size, high-resolution, and high-brightness display devices emerge as the times require. However, it is inevitable that defective products will be produced during the production process, and it is necessary to repair the produced defective products to save production costs. [0003] Generally, in the process of manufacturing the active element array substrate of the display device, inspection procedures are performed to detect defects, and laser repair processing is performed on the defects. For the display device designed with AHVA structure, during the productio...

AI Technical Summary

Problems solved by technology

At present, after the repair, the array substrate can only be retested to confirm whether the repair is successful. If the repair energy of the laser is too weak, it can be repaired again, but if the energy of the laser is too strong, it will break down the connection between the data line and the common electrode. The dielectric layer between the common electrode and the data line will cause a short circuit; if the energy is stronger, the source / drain of the thin film transistor will be broken down, causing the data line to be disconnected, which will not be able to be repaired again