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Method and device for product defect detection

A technology of product defects and detection methods, which is applied in the direction of optical testing flaws/defects, etc., can solve problems such as difficult to achieve high-precision detection, affect the quality of product defect detection, and cannot detect the transition round corners of product edges, etc., to achieve false detection rate Low and high precision defect detection, simple and reliable method

Active Publication Date: 2021-07-02
GUANGXI GUIHUA INTELLIGENT MFG CO LTD
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Problems solved by technology

However, the defect detection system currently used to detect defects in products (such as mobile phone glass covers) can only effectively detect defects in the straight line of the product edge, but cannot detect defects in the transition round corners of the product edge, which affects the quality of product defect detection. It is also difficult to achieve high-precision detection

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  • Method and device for product defect detection
  • Method and device for product defect detection
  • Method and device for product defect detection

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Embodiment Construction

[0041] Embodiments of the present invention will be described in detail below. It should be emphasized that the following description is only exemplary and not intended to limit the scope of the invention and its application.

[0042] In one embodiment, a product defect detection method comprises the following steps:

[0043] S1. Collect the original image of the product, and provide a blank image with one-to-one correspondence with the product pixels in the original image, and each pixel of the blank image is initially set to 0 according to the binary form;

[0044] S2. Perform a morphological operation on the original image to obtain a multilevel contour including the product's outer contour and one or more secondary inner contours;

[0045] S3. Extract the pixel point information of the outer contour of the product from the original image, and store it in an end-to-end linked list. The pixel point information includes the coordinate value of the pixel point, the gray value...

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Abstract

The invention provides a product defect detection method and device. The method extracts the outer contour of the product in the original image, and sequentially extracts the secondary inner contour by using morphological operations, stores the contour information in a linked list, and uses the contour information to identify Image processing to achieve high-precision defect detection. The defect detection method based on the contour information of the present invention achieves the defect detection of the edge transition fillet.

Description

technical field [0001] The invention relates to the field of defect detection, in particular to a product defect detection method and device. Background technique [0002] With the development of modern industrial manufacturing technology, the requirements for product quality control and automatic production are getting higher and higher. As an emerging industrial automation technology, defect detection technology based on machine vision has been widely used in all walks of life, replacing manual Product identification, positioning, defect inspection, motion guidance, etc., play an important role in high-speed assembly lines, dangerous environments, highly repetitive actions, high-precision inspections and other occasions where manpower is increasingly difficult to perform. [0003] Defect detection can be divided into two types from the working mode of the system, the area array system and the line array scanning system. application. With the increase of product size and ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88
Inventor 钱翔彭博李星辉周倩倪凯王晓浩
Owner GUANGXI GUIHUA INTELLIGENT MFG CO LTD