Unlock instant, AI-driven research and patent intelligence for your innovation.

NVMe solid state disk IOPS test method, system and device

A technology of solid-state hard drives and testing methods, applied in static memory, instruments, etc., can solve the problems of no solid-state hard drive judgment standards, low efficiency, and low accuracy, and achieve the effects of improving test efficiency, ensuring accuracy, and saving test time

Active Publication Date: 2019-08-09
INSPUR SUZHOU INTELLIGENT TECH CO LTD
View PDF7 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The IOPS (Input / Output Operations Per Second, the number of read and write operations per second) when the solid-state hard disk is in a steady state is an important indicator of the performance of the solid-state hard disk, but in the prior art, there is no clear standard for judging the steady state of the solid-state hard disk , when measuring the IOPS of the solid-state hard disk in a steady state, it is usually necessary to manually compare multiple groups of IOPS curves before and after to judge whether the IOPS of the solid-state hard disk is close to the steady state, which has low accuracy and low efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • NVMe solid state disk IOPS test method, system and device
  • NVMe solid state disk IOPS test method, system and device
  • NVMe solid state disk IOPS test method, system and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0042] The embodiment of the present invention discloses a NVMe solid state disk IOPS test method, seefigure 1 As shown, the method includes:

[0043] S11: According to the preset read-write ratio and data block size, randomly and continuously write the test data of the preset time threshold to the solid-state hard disk to be tested.

[0044] Specifically, in order to avoid the interference of the original residual data in the solid-state hard disk to be teste...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an NVMe solid state disk IOPS test method, system and device, and the method comprises the steps: S11, randomly and continuously writing test data with a preset time thresholdinto a to-be-tested solid state disk according to a preset read-write proportion and a data block size; S12, recording the IOPS of the solid state disk to be tested; S13, repeatedly executing the stepS11 until a preset measurement round is reached, and obtaining an average IOPS, a maximum IOPS, a minimum IOPS and an IOPS slope by utilizing the IOPS of the solid state disk to be measured obtainedin each round in the measurement window; S14, judging whether a steady-state judgment condition is met or not; S15, if yes, recording the IOPS of the to-be-measured solid state disk obtained in each round in the measurement window, and obtaining a steady-state IOPS curve of the to-be-measured solid state disk; S16, if not, returning to the step S11 until a preset termination round is reached. According to the method, the system and the device, the steady-state judgment condition is clearly set, the accuracy of the output steady-state IOPS curve is ensured. Meanwhile, whether the steady state is reached or not does not need to be judged through multiple groups of front and back test results, the test time is saved, and the test efficiency is improved.

Description

technical field [0001] The invention relates to the field of solid-state hard disks, in particular to an IOPS testing method, system and device for NVMe solid-state hard disks. Background technique [0002] With the rapid development of information technology and the explosive growth of data, AHCI / SATA hard disks (AHCI, Serial ATA Advanced Host Controller Interface, Serial ATA Advanced Host Controller Interface, SATA, Serial ATA (serial hard drive) is gradually unable to do what it wants in terms of performance and transmission speed. In order to fully exploit the performance of the PCIe interface (PCIe, peripheral component interconnect express), Intel and a number of companies have developed and formulated the NVMe standard (NVMe, Non-Volatile Memory express) , NVMe SSD (SSD, Solid State Disk, solid state drive) is nearly 6 times faster than SATA SSD read and write performance. [0003] The IOPS (Input / Output Operations Per Second, the number of read and write operations ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/54G11C29/56
CPCG11C29/54G11C29/56
Inventor 王朋
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD