Unlock instant, AI-driven research and patent intelligence for your innovation.

A CMOS Image Sensor Clamping Method Using Divided Bit Lines

An image sensor and bit line technology, which is applied in image communication, electrical solid-state devices, semiconductor devices, etc., can solve problems such as bit line stabilization time limit

Active Publication Date: 2021-08-20
OMNIVISION TECH INC
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The frame rate used to read out the image from the image sensor is limited by the bit line stabilization time

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A CMOS Image Sensor Clamping Method Using Divided Bit Lines
  • A CMOS Image Sensor Clamping Method Using Divided Bit Lines
  • A CMOS Image Sensor Clamping Method Using Divided Bit Lines

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Methods and apparatus for dividing bit lines in imaging circuits are disclosed. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the embodiments. One skilled in the relevant art will recognize, however, that the techniques described herein may be practiced without one or more of the specific details, and with other methods, components, materials, etc. In other instances, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring certain aspects.

[0022] Reference throughout this specification to "one example" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the example is included in at least one example of the invention. Thus, appearances of the phrase "in one instance" or "in one embodiment" in various places throughout this specification are not necessarily all referring to the same instance. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present application relates to a method of clamping a CMOS image sensor using divided bit lines. An image sensor includes a pixel array including a plurality of pixels. Bit lines are coupled to the pixel columns of the pixel array. The bit lines are split into portions coupled to the columns of pixels. The portions of the bit lines are electrically isolated from each other. Readout circuitry is coupled to a first portion of the bit line coupled to a first portion of a row of pixels from the column of pixels to read image data from the first portion of the row of pixels from the column of pixels. The readout circuit is further coupled to a second portion of the bit line coupled to a second portion of a row of pixels from the column of pixels to read from the second portion of the row of pixels from the column of pixels image data.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of U.S. Provisional Application No. 62 / 634,754, filed February 23, 2018, the contents of which are incorporated herein by reference. technical field [0003] The present disclosure relates generally to bitlines, and more particularly, but not exclusively, to bitlines for use with image sensors. Background technique [0004] Image sensors have become ubiquitous. They are widely used in digital still cameras, cellular phones, security cameras, as well as in medical, automotive and other applications. The technology for fabricating image sensors, and in particular complementary metal-oxide-semiconductor (CMOS) image sensors (CMOS image sensors (CIS) ), has continued to advance rapidly. For example, the need for higher resolution and lower power consumption has driven further miniaturization and integration of these image sensors. [0005] Pixels included in an image sensor include p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/374H04N5/3745H04N5/378
CPCH04N25/766H04N25/76H04N25/78H01L27/14634H04N23/57H01L27/14636H01L27/14643H04N25/75H04N25/772
Inventor 海老原弘知
Owner OMNIVISION TECH INC