Unlock instant, AI-driven research and patent intelligence for your innovation.

A simplified epitaxial flip-chip vcsel chip and its manufacturing method

A manufacturing method and epitaxial wafer technology, applied in laser parts, semiconductor lasers, electrical components, etc., can solve the problems of difficult oxidation control, high epitaxy requirements, local crystal defects, etc., to simplify epitaxial growth and improve carrier Density, VF reduction effect

Active Publication Date: 2020-12-25
威科赛乐微电子股份有限公司
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, all VCSELs need to grow the DBR layer and oxide layer during epitaxial preparation, and the oxidation of the oxide layer is a difficult operation at the chip end, which is a difficult process to control.
DBR growth has high requirements for epitaxy, and oxidation control is difficult. Conventional VCSEL chip design or process is not "perfect", resulting in local crystal defects, which are difficult to detect by conventional shipment testing; but in the process of chip work, crystal defects Under the stimulation of high temperature, high current and strong photons, the growth will be accelerated. After a period of time, once the rupture growth exceeds a certain value or reaches the active area, the chip will fail.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A simplified epitaxial flip-chip vcsel chip and its manufacturing method
  • A simplified epitaxial flip-chip vcsel chip and its manufacturing method
  • A simplified epitaxial flip-chip vcsel chip and its manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0033] It should be noted that in the drawings or descriptions, similar or identical parts use the same figure numbers, and implementations not shown or described in the drawings are forms known to those of ordinary skill in the art. Additionally, while illustrations of parameters including particular values ​​may be provided herein, it should be understood that the parameters need not be exactly equal to the corresponding values, but rather may approximate the corresponding values ​​within acceptable error margins or design constraints. The directional terms mentioned in the embodiments, such as "up", "down", "top", "bottom", "left", "right", etc., are only referring to the directions of the drawings, and are not intended...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention relates to the technical field of electronic chips, and discloses a reduced epitaxial flip-chip VCSEL chip and a manufacturing method thereof. The VCSEL chip comprises a quantum well, a first transition layer and a second transition layer, wherein a first ohmic contact layer grows on the first transition layer; a first ODR column grows on the first ohmic contact layer; vacuum evaporation of a mirror layer on the first ODR column is carried out; a SiO2 protective layer grows on the side wall of the mirror layer; vacuum evaporation of an epitaxial wafer bonding layer on the mirror layer is carried out; a Si wafer is arranged on the epitaxial wafer bonding layer; vacuum evaporation of metal on the Si wafer is carried out to form P-contact; a second ohmic contact layer grows on the second transition layer; a second ODR column grows on the second ohmic contact layer; vacuum evaporation of metal on the second ODR column is carried out to form N-contact; and the upper surface of the second ODR column is provided with a light-emitting hole by N-contact. An oxidation process which is difficult to control does not exist in the manufacturing method, the N-contact in the chip is directly connected to the epitaxial wafer, the portion requiring heat dissipation is reduced, the power efficiency and the slope efficiency are improved, ITO makes current expansion more uniform, and generation of a transverse mode is reduced.

Description

technical field [0001] The invention relates to the technical field of electronic chips, in particular to a simplified epitaxial flip-chip VCSEL chip and a manufacturing method thereof. Background technique [0002] The full name of VCSEL is Vertical Cavity Surface Emitting Laser, referred to as surface-emitting laser. Unlike traditional edge-emitting lasers, the laser emission direction of VCSEL is perpendicular to the substrate surface, and a circular spot can be obtained. Because the resonant cavity length is close to the wavelength, the dynamic single-mode performance is relatively good, it has high luminous efficiency, extremely low power consumption, good beam quality, easy fiber coupling, adjustable frequency up to several GHz, ultra-narrow linewidth, extremely The advantages of high beam quality, high polarization ratio and low cost. [0003] In the process of VCSEL preparation, the probability of crystal defects caused by stress and manufacturing process is much hi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01S5/343H01S5/022H01S5/183
CPCH01S5/183H01S5/3432H01S5/3436H01S5/0234
Inventor 窦志珍曹广亮刘留苏小平韩春霞林新茗
Owner 威科赛乐微电子股份有限公司