A Comprehensive Method for Quantitatively Evaluating the Aging Degree of Nuclear Grade Cables
A technology of aging degree and quantitative evaluation. It is used in measuring devices, instruments, and material analysis by optical means. It can solve problems such as lack of more effective methods, inability to accurately predict the aging law and service life of materials, etc.
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Embodiment 1
[0030] Example 1: Quantitative evaluation of the aging degree of nuclear-grade cable sheath materials
[0031] After a certain ethylene-propylene rubber cable sheath material is irradiated with γ-rays at a fixed dose rate of 10 kGy / h, and subjected to different irradiation times, its elongation at break is measured according to step (1), and a graph is drawn. See figure 1 , it can be seen that the elongation at break shows a law of first-order exponential decay with the prolongation of irradiation time, and it drops to half of the initial value at about 100h;
[0032] The samples subjected to different irradiation times were made into cross-sectional thin slice samples according to the method of step (2), as shown in the schematic diagram figure 2 shown.
[0033] According to the method of step (3), the surface of the thin slice sample prepared in step (2) is scanned by using micro-infrared analysis technology.
[0034] According to the requirements of step (4), taking the...
Embodiment 2
[0037] Example 2: Quantitative evaluation of the aging degree of nuclear grade cable insulation materials
[0038] Under the condition of 500 kGy fixed cumulative dose of γ-ray irradiation, an ethylene-propylene rubber cable insulation material was irradiated with different dose rates (that is, different irradiation times), and its volume resistivity was measured according to step (1). and plot, see Image 6, it can be seen that the volume resistivity decreases first and then increases with the prolongation of the irradiation time, but the data dispersion is relatively large;
[0039] The samples subjected to different radiation dose rates are made into cross-sectional thin slice samples according to the method of step (2), as shown in the schematic diagram figure 2 shown.
[0040] According to the method of step (3), the surface of the thin slice sample prepared in step (2) is scanned by using micro-infrared analysis technology.
[0041] According to the requirements of s...
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