Novel testing equipment

Abstract

The invention discloses novel testing equipment, and aims to provide the novel testing equipment which is large in knit stitch density, high in precision, convenient for product upgrading and maintenance and relatively high in economical efficiency. The testing equipment comprises an equipment body, a drawer and a pressing plate, wherein the drawer is arranged in the equipment body in a sliding mode; the inner sides of the two sides of the equipment body are provided with pressing devices; the two ends of the pressing plate are connected with the corresponding pressing devices and located above the drawer; a PCBA plate testing assembly matched with the pressing plate is arranged on the drawer; the PCBA plate testing assembly comprises a carrying plate, a needle plate, a WIB plate and an SIB plate which are sequentially arranged from top to bottom; the carrying plate and the WIB plate are matched with the needle plate; the WIB plate is matched with the SIB plate; and during testing, a PCBA plate to be tested is placed on the carrying plate, the pressing devices are pressed down, the upper end of a probe on the needle plate penetrates through the carrying plate to be in contact withthe PCBA plate, and the lower end of the probe is in contact with the WIB plate. The testing equipment can be applied to the technical field of detection equipment.

Description

Technical field [0001] The invention can be applied to the technical field of testing equipment, and relates to a new type of testing equipment. Background technique [0002] Functional test fixture: PCBA functional test equipment. The test object is the PCBA circuit board. The probe is used as the contact medium between the PCBA board and the external circuit for corresponding tests, including voltage, current, power, power factor, frequency, duty cycle; scanning code reading, character recognition, voice recognition; temperature Measurement, pressure measurement, motion control, FLASH and EEPROM burning, etc. [0003] Probe: The contact medium for electrical testing to realize the connection between the external circuit and the target PCBA board. Probes include test probes, semiconductor probes, ICT probes, high frequency probes, high current probes, battery contact probes, etc. [0004] The wireless interface board is connected to the tail of the probe to receive the signal col...

AI Technical Summary

Problems solved by technology

[0007] In the existing test equipment, the needle board and the test board are integrally fixed inside the fixture and cannot be moved. In order to ensure that the carrier board on the access drawer and the PCBA product enter and exit the fixture, a large gap will be reserved between the needle board and the drawer tray , to prevent the probes on the needle board from hitting the needle board when the drawer is in and out; Through the guide pin hole of the carrier board, the diameter of the guide pin hole is larger than the diameter of the probe needle by 0.1mm-0.12mm. The pinhole increases the distance between adjacent probes, which is not conducive to the high-density and high-precision pinning of the PCBA board; due to the test There is a one-to-one correspondence between the test points, probes and test points of the PCBA. The upgrade of the product requires re-layout and production of the test board and needle board, which cannot be reused, making the production cost of the PCBA fixture high and the production cycle short. Long, poor economy; product upgrades to replace the needle board and test board, but the needle board and test board are fixed inside the fixture as a whole, making product upgrades and maintenance difficult

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