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Dust-free processing technique for chip silicon production

A processing technology and chip technology, which is applied in the field of dust-free processing technology for chip silicon production, can solve problems such as processing obstacles and lower wafer processing quality, and achieve the elimination of dust, the influence of dust adhesion on its surface, and the reduction of defects. effect of influence

Inactive Publication Date: 2019-11-19
DATONG XINCHENG NEW MATERIAL CO LTD
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  • Summary
  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

The production of chip silicon needs to go through steps such as crystal pulling, generation of single crystal silicon ingots, wafer slicing, wafer processing, etching and polishing, among which a large amount of dust will be generated during wafer processing, especially during wafer processing During the corner grinding and grinding process, the dust generated falls on the grinding equipment and the wafer. During the grinding and grinding process, it will hinder the processing to a certain extent and reduce the processing quality of the wafer.

Method used

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Embodiment Construction

[0019] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be described in detail below. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other implementations obtained by persons of ordinary skill in the art without making creative efforts fall within the protection scope of the present invention.

[0020] The invention provides a dust-free processing technology for chip silicon production, comprising the following processing steps:

[0021] Step a, pull the crystal, place the raw material in the crucible, remove the silicon raw material from the raw material, and add a dopant to the raw material to make the grown single crystal silicon ingot show the required electrical characteristics. After the raw material is completely dissolved, place the seed crystal...

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Abstract

The invention discloses a dust-free processing technique for chip silicon production, which includes the following processing steps: a, crystal pulling: placing raw materials in a crucible, putting aseed crystal on the surface of a melted object after the raw materials are completely dissolved, and performing a crystal pulling operation until a monocrystalline silicon ingot having a larger diameter than a final wafer is pulled out; b, the preliminary processing of the monocrystalline silicon ingot; c, wafer slicing; d, wafer dust-free fine processing; e, etching and cleaning; f, wafer polishing and cleaning; and g, quality inspection. The processing technique has beneficial effects that negative-pressure dust collection is performed on a polished part through corner polishing and surfacepolishing steps in a wafer processing procedure so as to reduce and eliminate dust generated during the wafer processing, thereby achieving dust-free processing during the chip silicon production process, reducing the adverse effects of dust on equipment operation during the processing, eliminating the influence of dust adhesion on the surface of the wafer during wafer processing, and improving wafer processing quality.

Description

technical field [0001] The invention relates to the technical field of chip silicon processing, in particular to a dust-free processing technology for chip silicon production. Background technique [0002] Chip silicon refers to the processed semiconductor silicon wafer, which is the basic material for making integrated circuits and discrete devices. The production of chip silicon needs to go through steps such as crystal pulling, generation of single crystal silicon ingots, wafer slicing, wafer processing, etching and polishing, among which a large amount of dust will be generated during wafer processing, especially during wafer processing During the corner grinding and grinding process, the dust generated falls on the grinding equipment and the wafer. During the grinding and grinding process, it will hinder the processing to a certain extent and reduce the processing quality of the wafer. When processing circuits, the dust on the surface of the wafer will have a great adv...

Claims

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Application Information

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IPC IPC(8): H01L21/02H01L21/304H01L21/306H01L21/66
CPCH01L21/02H01L21/304H01L21/30604H01L22/12
Inventor 李义
Owner DATONG XINCHENG NEW MATERIAL CO LTD
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