Structure light-based three-dimensional measurement method and system
A three-dimensional measurement and structured light technology, applied in the field of three-dimensional measurement, can solve the problems of inability to measure spatially discontinuous objects, obstructing objects, and inability to measure spatially discontinuous objects.
Active Publication Date: 2019-12-31
成都盛锴科技有限公司
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[0004] In view of this, this application aims at the defects that the traditional structured light 3D measurement method cannot measure spatially discontinuous objects and occluded objects, and proposes to use the basic principle of phase measurement profilometry as the basis, combined with computer vision related technologies, to achieve 3D data acquisition under phase truncation , successfully solved the problem that the structured light method cannot measure spatially discontinuous objects, and can accurately measure spatially discontinuous or 3D scenes with occlusions, which has wide application value
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[0079] The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0080] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0081] The principle of the invention of this application is: the light source unit projects a set of grating fringe images with a fixed phase shift to the measured object, and the two imaging units sho...
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The invention relates to the technical field of three-dimensional measurement methods. The embodiment of the invention particularly discloses to a phase shift grating strip structure light-based three-dimensional measurement method and system. A group of grating strip images with fixed phase shift is projected to a measured object by a light source unit, two imaging units are respectively used forshooting the group of measured object images comprising phase shift grating from setting angles, the absolute depth of the object can be obtained by phase calculation, so that three-dimensional measurement is achieved, the problem that three-dimensional measurement cannot be performed due to phase interrupt under the conditions of space incontinuity and shielding of the measured object is solved,and the three-dimensional measurement method and system has wider practicability.
Description
Technical field [0001] The invention relates to the technical field of three-dimensional measurement methods, in particular to a method and system for three-dimensional measurement based on phase shift grating fringe structured light. Background technique [0002] At present, three-dimensional reconstruction and three-dimensional measurement are widely used in the field of computer vision. Compared with two-dimensional images, three-dimensional information records the actual information of the scene more comprehensively. Three-dimensional measurement is the key technical foundation in reverse engineering and object shape detection. [0003] The commonly used three-dimensional measurement methods at this stage are: time-of-flight method, stereo vision method and structured light method. The accuracy of the time-of-flight method is affected by hardware synchronization and response accuracy, and it is difficult to improve the accuracy. The three-dimensional information obtained by ...
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IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 杨凯梁斌高春良谢利明白子健文鑫王峰
Owner 成都盛锴科技有限公司