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A three-dimensional measurement method and system based on structured light

A technology of three-dimensional measurement and structured light, applied in the field of three-dimensional measurement, can solve the problems of inability to measure spatially discontinuous objects, objects with occlusions, and inability to measure spatially discontinuous objects

Active Publication Date: 2021-04-20
成都盛锴科技有限公司
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  • Application Information

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Problems solved by technology

[0004] In view of this, this application aims at the defects that the traditional structured light 3D measurement method cannot measure spatially discontinuous objects and occluded objects, and proposes to use the basic principle of phase measurement profilometry as the basis, combined with computer vision related technologies, to achieve 3D data acquisition under phase truncation , successfully solved the problem that the structured light method cannot measure spatially discontinuous objects, and can accurately measure spatially discontinuous or 3D scenes with occlusions, which has wide application value

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  • A three-dimensional measurement method and system based on structured light
  • A three-dimensional measurement method and system based on structured light
  • A three-dimensional measurement method and system based on structured light

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[0079] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0080] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0081] The principle of the invention of this application is: the light source unit projects a set of grating fringe images with fixed phase shift to the measured object, and the two imagin...

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Abstract

The invention relates to the technical field of three-dimensional measurement methods, and the embodiment specifically discloses a method and system for three-dimensional measurement based on phase-shift grating stripe structured light. The light source unit projects a set of grating fringe images with a fixed phase shift to the measured object, and the two imaging units respectively take this set of images of the measured object containing the phase-shifted grating from the set angle, and the absolute phase of the object can be obtained by calculating the phase Depth, so as to realize three-dimensional measurement, solve the problem that the phase truncation cannot be used for three-dimensional measurement when the measured object has spatial discontinuity and occlusion, and has wider practicability.

Description

technical field [0001] The invention relates to the technical field of three-dimensional measurement methods, in particular to a method and system for three-dimensional measurement based on phase-shifted grating stripe structured light. Background technique [0002] At present, 3D reconstruction and 3D measurement are widely used in the field of computer vision. Compared with two-dimensional images, three-dimensional information more comprehensively records the actual information of the scene. Three-dimensional measurement is the key technical foundation in reverse engineering and object shape detection. [0003] The commonly used three-dimensional measurement methods at this stage are: time-of-flight method, stereo vision method and structured light method. The accuracy of the time-of-flight method is affected by hardware synchronization and response accuracy, and it is difficult to improve the accuracy. The three-dimensional information obtained by the stereo vision met...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 杨凯梁斌高春良谢利明白子健文鑫王峰
Owner 成都盛锴科技有限公司