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Chip test connecting device and chip test system

A technology for chip testing and connecting devices, applied in measuring devices, electronic circuit testing, measuring electricity, etc., can solve the problems of wear and damage of various devices, increase maintenance time, affect test efficiency, etc., to reduce maintenance difficulty and reduce maintenance. Difficulty, the effect of reducing hardware costs

Pending Publication Date: 2020-03-20
CHANGXIN MEMORY TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, wear and damage of various devices often occur during the test process. During maintenance, the chip test socket needs to be removed before maintenance, which increases the maintenance time and affects the test efficiency.

Method used

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  • Chip test connecting device and chip test system
  • Chip test connecting device and chip test system
  • Chip test connecting device and chip test system

Examples

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Embodiment Construction

[0038] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar structures, and thus their detailed descriptions will be omitted.

[0039] After the chip is produced, it needs to be tested to determine whether it meets the work requirements. In the final stage of chip testing, the chip is first placed on the chip test socket, then the chip is connected to the loading circuit board, and finally the loading circuit board Install it on a chip testing machine to test the chip.

[0040] refer to figure 1 and figure 2 , the length of the elastic structure 20...

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Abstract

The invention relates to the technical field of semiconductors, and provides a chip test connecting device, which is characterized in that each of a plurality of connectors is provided with a first end and a second end which are oppositely arranged, the first end is fixed on a loading circuit board, and the second end is an elastic contact for connecting a chip; and a plurality of guide plates arefixed on the loading circuit board and are used for bearing the chip. The connector is directly connected with the loading circuit board, and compared with the prior art, the chip test connecting device cancels a chip test seat device and can achieve the effects of being convenient to disassemble and assemble, reducing the maintenance difficulty, improving the test efficiency, reducing the hardware cost and the like.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a chip test connection device and a chip test system installed with the chip test connection device. Background technique [0002] After the chip is produced, it needs to be tested. In the final testing stage, the chip needs to be placed on the chip test socket, the test socket is connected to the loading circuit board, and finally connected to the testing machine through the loading circuit board. [0003] In the prior art, various devices are often worn and damaged during the testing process. During maintenance, the chip test socket needs to be removed before maintenance, which increases the maintenance time and affects the testing efficiency. [0004] Therefore, it is necessary to design a new chip test connection device and a test system installed with the chip test connection device. [0005] The above information disclosed in this Background section is only for enha...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851G01R31/2884
Inventor 陆玉斌
Owner CHANGXIN MEMORY TECH INC