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Anode and its preparation method and cathode emission test device

A technology of anode and cathode, applied in the field of vacuum electronic devices, can solve the problems of low test efficiency and achieve the effects of improved test efficiency, convenient operation, and simple device structure

Active Publication Date: 2021-10-29
INST OF ELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Currently, the test efficiency is low due to the limitations of the anode for cathode emission testing in vacuum electronics

Method used

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  • Anode and its preparation method and cathode emission test device
  • Anode and its preparation method and cathode emission test device
  • Anode and its preparation method and cathode emission test device

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Embodiment Construction

[0025] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. It should be understood, however, that these descriptions are exemplary only, and are not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present disclosure.

[0026] An embodiment of the present disclosure provides an anode for testing the cathode emission performance of a vacuum electronic device, figure 1 Schematically showing a structural diagram of an anode for testing the cathode emission performance of a v...

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Abstract

An anode, used for testing the emission performance of the cathode of a vacuum electronic device, the anode comprises: an anode body (2) and an anode head (6), wherein, the anode head (6) is a polyhedron structure, one side of which is connected to the One end of the anode body (2), and the remaining surfaces correspond to a cathode (1) respectively, so as to test the emission performance of the cathode (1). The anode head in the anode is a polyhedron structure, and the air permeability of the closed space between the anode head and the anode body is very low, so that the cathode emission test device can simultaneously test the emission performance of multiple cathodes on one anode without mutual influence, and can The emission performance of multiple cathodes is tested in a vacuum test chamber, thereby greatly improving the test efficiency of cathode emission performance. At the same time, the test efficiency is further improved by rationally designing the materials of the anode body and the anode head. In addition, the device has a simple structure and is easy to operate.

Description

technical field [0001] The disclosure relates to vacuum electronic device technology, in particular to an anode, a preparation method thereof, and a cathode emission testing device. Background technique [0002] Due to their unique functions and superior performance, vacuum electronic devices are widely used in radar, satellite communication, electron accelerator, global positioning, controllable thermonuclear fusion and high-power microwave weapons in the future military frontier, especially in high-power In the case of high-frequency and high-frequency bands, vacuum electronic devices cannot be replaced by other devices. Modern high-tech microwave devices continuously put forward new development requirements for the power, frequency, bandwidth and other working characteristics of microwave signals. These requirements are mainly manifested in higher frequency, higher power, wider frequency band, higher efficiency and New working characteristics bring new challenges and dev...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J1/13H01J9/02
CPCH01J1/13H01J9/02
Inventor 刘燕文王国建田宏朱虹李芬孟鸣凤赵恒邦谷兵
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
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