Scan field variation compensation
A technology of scanning area and irradiation source, applied in program control, instrument, processing and manufacturing, etc., can solve problems such as non-equilibrium phase and high thermal stress of solidified materials
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[0024] Reference will now be made in detail to embodiments of the invention, one or more examples of which are illustrated in the drawings. Each example is provided by way of illustration of the invention, not limitation of the invention. In fact, it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the scope or spirit of the invention. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield a still further embodiment. Thus, it is intended that the present invention covers such modifications and variations as come within the scope of the appended claims and their equivalents.
[0025] figure 2An example of one embodiment of a large-scale AM device that may be used with the present invention is shown. The apparatus includes a positioning system (not shown), a build unit 400 including an illumination emission guide 40...
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