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Specimen measurement system and rack conveyance method

A technology for measuring systems and samples, applied in the direction of analyzing materials, instruments, etc., can solve problems such as not being able to improve system processing capabilities

Pending Publication Date: 2020-11-10
SYSMEX CORP
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, if the reagents used in sample measurement and the sample to be measured cannot be smoothly supplied to a plurality of sample measurement units, increasing the number of sample measurement units cannot improve the throughput of the system.

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  • Specimen measurement system and rack conveyance method
  • Specimen measurement system and rack conveyance method
  • Specimen measurement system and rack conveyance method

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Embodiment approach 2

[0267] Other embodiments of the present invention will be described below. For convenience of description, members having the same functions as those described in the above-mentioned embodiments are given the same reference numerals, and the description thereof will not be repeated.

[0268] In the sample measurement units 1a and 1b, if any of consumables, samples, and reagents are exhausted, sample measurement cannot be performed. For example, when any of the first transport path F, the second transport path KF, and the reagent container transport path LF included in the sample measurement system 100 fails, the consumables, samples, and reagents of the sample measurement units 1a and 1b will be damaged. Supply cut off. At this time, the sample measurement in the sample measurement system 100 is stopped until the failure of the first transport path F, the sample transport path KF, the reagent container transport path LF, and the like is resolved.

[0269]In recent years, the...

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Abstract

Provided are a specimen measurement system and a rack conveyance method with which the supply of consumable articles to a plurality of specimen measurement units can be carried out collectively. A specimen measurement system (100) comprises: a plurality of specimen measurement units (1a, 1b) that perform measurement of a specimen using a consumable article; a consumable article rack disposition unit (21) in which consumable article racks are disposed; a first conveyance path (F) for supplying the consumable article racks disposed in the consumable article rack disposition unit (21) to each ofthe plurality of specimen measurement units (1a, 1b); a consumable article rack collection unit (22) that collects empty racks which have become empty after passing through at least one of the plurality of specimen measurement units (1a, 1b); and a second conveyance path (R) that conveys the empty racks to the consumable article rack collection unit (22).

Description

technical field [0001] The present invention relates to a sample measurement system including a plurality of sample measurement units that perform sample measurement using common consumables, and a rack transport method for supplying racks containing a plurality of consumables to the plurality of sample measurement units. Background technique [0002] A system for automatically measuring a plurality of samples by combining sample measurement units for measuring the plurality of samples has been proposed. In such a system, the throughput of sample measurement can be improved by adding a plurality of sample measurement units for measuring samples in the system. [0003] However, if the reagents used for sample measurement, the sample to be measured, and the like cannot be smoothly supplied to a plurality of sample measurement units, increasing the number of sample measurement units cannot improve the throughput of the system. Therefore, various technologies related to how to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N35/04
CPCG01N35/04G01N2035/0412G01N35/026G01N2035/0094G01N2035/0465G01N2035/0403G01N2035/0406G01N2035/0496
Inventor 增谷晃一若宫裕二
Owner SYSMEX CORP
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