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A curved surface standard device for calibration of large-scale scanning measuring instruments

A technology of measuring instruments and standard devices, which is applied in the field of geometric quantity measurement, can solve the problems of inseparability, lack of standard physical means for the verification of surface evaluation methods, and the inability to realize large-scale surface contour calibration and evaluation of different color materials in large-scale scanning measurement systems. Achieve the effect of color error calibration

Active Publication Date: 2021-08-31
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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Problems solved by technology

[0008] Through the above analysis, the existing small-area scanning measuring instruments have corresponding calibration methods and physical standards, and currently only the National Institute of Standards and Technology (NIST) has established a ball array scanning system calibration device for large-scale scanning measuring instruments, but This set of devices is limited by the diameter of the ball, and it cannot effectively separate the influencing factors of the scanning incident angle error during long-distance scanning, which in turn affects the calibration of the detection error and the ball space length error. At the same time, there is a lack of standard objects for the verification of the surface evaluation method. Therefore, the calibration and evaluation of the large-scale surface profile measurement of the large-scale scanning measurement system and the evaluation of different color materials cannot be realized.

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  • A curved surface standard device for calibration of large-scale scanning measuring instruments
  • A curved surface standard device for calibration of large-scale scanning measuring instruments
  • A curved surface standard device for calibration of large-scale scanning measuring instruments

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Embodiment Construction

[0035] The present invention will be further described below in conjunction with the accompanying drawings and implementation examples.

[0036] See attached figure 1 As shown, a curved surface standard device for calibrating large-scale scanning measuring instruments disclosed in this embodiment is composed of four parts, one is a heavy-duty rotary table 101, the other is an external support frame 102, and the third is a high-precision curved surface standard 103 , the fourth is thermal expansion release assembly 104. The heavy-duty turntable 101 is the basis of the entire curved surface standard device, and is used to adjust the rotation posture of the curved surface standard device; the bottom of the external support frame 102 is connected with the heavy-duty turntable 101, and is used to install the support curved surface standard 103; the high-precision curved surface standard 103 is used In order to provide a large-scale curved surface standard and a series of reference...

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Abstract

The invention discloses a curved surface standard device used in the calibration of large-scale scanning measuring instruments, which belongs to the field of geometric quantity calibration. The invention is mainly composed of four parts, one is a heavy-duty rotary table with an external support frame, the other is an external support frame with a curved surface standard, the third is a high-precision curved surface standard, and the fourth is a thermal expansion release assembly. The invention provides rotatable large-scale curved surface standards and series of reference targets, and effectively ensures that the high-precision curved surface standards can provide stable curved surface physical standards and reference target space coordinate standards within the allowable range of laboratory temperature changes, and can be used for large Dimensional scanning measuring instruments are used to calibrate large-scale surface profile measurement errors, which facilitates the performance evaluation of the calibrated equipment under various incident angle conditions, and at the same time reduces the entire calibration space while meeting the requirements of the incident angle. The large-scale scanning measuring instruments include laser radar, laser tracking scanners, ground scanners, hand-held scanners and other measurement systems.

Description

technical field [0001] The invention belongs to the field of geometric quantity measurement, and relates to a curved surface standard device applied to the calibration of large-scale scanning measuring instruments, in particular to a standard device directly applied to large-scale scanning measuring instruments including laser radar, laser tracking scanner, ground scanner, Calibration device for scanning measurement systems such as handheld scanners. Background technique [0002] Large-scale scanning measuring instruments are widely used in profile detection in high-end manufacturing industries such as aircraft complete machines and skins, complex curved composite molds, large satellite antennas, and compact field antennas. In order to realize the accurate measurement of the geometrical profile of this series of large curved surfaces, it is necessary to accurately trace the value of such large-scale scanning measurement equipment to ensure the quality of manufacturing, assem...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24G01S7/497
CPCG01B11/24G01S7/497
Inventor 孙安斌王继虎乔磊马骊群曹铁泽高廷樊晶晶李洋
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA