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Electroluminescent device working condition in-situ analysis system and analysis method

An electroluminescent device, in-situ analysis technology, applied in the direction of single semiconductor device testing, instrumentation, measuring electricity, etc. There are many problems such as the lack of research on the rate micro-area spectral test system and the electrical response.

Active Publication Date: 2020-12-11
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] (2) At present, the spectroscopy testing methods for solution-based LEDs usually use large-area and macroscopic detection, and a high-spatial-resolution, multi-scale micro-area spectral testing system has not yet been developed.
[0009] (3) At present, the optoelectronic characterization of solution-based LEDs is usually based on multiple independent test instruments, and a multi-functional and integrated test system has not yet been developed.
[0010] (4) The transient electroluminescence and transient current characterization of LEDs are important methods to reveal the working mechanism and internal thermal effects of devices. However, the current research on the electrical response of solution-based LEDs in the high frequency range (100 MHz to GHz) is very lacking.
[0011] (5) At present, the working life test equipment of solution-based LED devices usually only focuses on the change of device electroluminescence brightness with time, and has not yet developed a long-term, automatic, multi-mode photoelectric property monitoring system during the device aging process

Method used

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  • Electroluminescent device working condition in-situ analysis system and analysis method

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Embodiment 1

[0125] Electronically pumped in situ microdomain steady-state photoluminescence analysis.

[0126] In this embodiment, the working principle of the in-situ analysis system for electroluminescence device working conditions is as follows: figure 2 As shown, the digital source meter 013 is used to apply electrical excitation to the LED device sample 001 to be tested, and the source meter outputs voltage and current information to the data acquisition system 024 at the same time. While the device is electroluminescent, the second lock-in amplifier 012b is used to generate a high-frequency reference signal, which is input to the picosecond pulse laser 003 for external triggering, and at the same time input to the first lock-in amplifier 012a as an external reference signal. The picosecond pulse laser 003 generates periodic pulse excitation light under external trigger, enters the objective lens 026 through the first half mirror 005a and the beam splitter 006, and focuses on the li...

Embodiment 2

[0140] Electrically pumped in situ microdomain transient photoluminescence analysis.

[0141] In this embodiment, the working principle of the in-situ analysis system for electroluminescence device working conditions is as follows: image 3 As shown, the digital source meter 013 is used to apply electrical excitation to the LED device sample 001 to be tested, and the source meter outputs voltage and current information to the data acquisition system 024 at the same time. While the device is electroluminescent, a picosecond pulse laser 003 is used to generate pulsed excitation light, which enters the objective lens 026 through the half mirror 005a and the beam splitter 006, and is focused on the light emitting surface of the LED device sample 001. The reference electrical signal generated by the picosecond pulsed laser 003 is connected to a time-correlated single photon counter 023 . The electroluminescence signal and the photoluminescence signal of the device are collected th...

Embodiment 3

[0156] Electrically pumped single-molecule transient photoluminescence analysis.

[0157] In this embodiment, the working principle of the in-situ analysis system for electroluminescence device working conditions is as follows: Figure 4As shown, the digital source meter 013 is used to apply electrical excitation to the LED device sample 001, and the source meter outputs voltage and current information to the data acquisition system 024 at the same time. While the single-molecule LED device emits single-molecule electroluminescence, the picosecond pulse laser 003 is used to generate pulsed excitation light, which enters the 60x oil immersion objective lens 026 through the half-transparent mirror 005a and the beam splitter mirror 006, and focuses on the sample. Luminous molecules. The reference electrical signal generated by the picosecond pulsed laser 003 is connected to a time-correlated single photon counter 023 . The single-molecule electroluminescence signal and the sing...

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Abstract

The invention discloses an electroluminescent device working condition in-situ analysis system and analysis method. The system comprises an excitation light path part, an electric excitation source part, a collection light path part, a signal detection and analysis part, a frequency modulation and synchronization part, and an instrument mechanical control part. The system provided by the inventionis multi-mode, multi-dimensional and multi-scale, and organically combines various advanced spectroscopy tests, a phase-locked amplification technology, a semiconductor device electrical test, an automatic two-dimensional displacement system, a microscope system, an instrument control system and the like. An energy loss path, a monomolecular level working mechanism and a device aging mechanism ofthe device can be directly disclosed, and future material chemistry and device structure innovation can be guided.

Description

technical field [0001] The invention belongs to the technical field of photoelectric measuring instruments, and in particular relates to an in-situ analysis system and analysis method for working conditions of electroluminescent devices. Background technique [0002] Light-emitting diodes (LEDs) are core components in the two major industries of new displays and solid-state lighting. Among them, new solution-based LEDs such as OLEDs, quantum dot LEDs (QLEDs) and perovskite LEDs (PeLEDs) that use solution-based processes are experiencing rapid development, and are gradually moving from the laboratory to the industry. [0003] It is very important to fully understand the basic physical and chemical processes inside the device during the working process, and reveal the energy loss mechanism and working aging mechanism of the device to guide the development of new solution-based LED devices with high efficiency and long life. Therefore, using in-situ spectroscopy measurement an...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01R31/265
CPCG01R31/2635G01R31/2642G01R31/2656
Inventor 邓云洲金一政
Owner ZHEJIANG UNIV