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X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry

A fluorescence analyzer, X-ray technology, applied in the field of X-ray fluorescence analysis, can solve the problems of increasing statistical error, difficult measurement, low intensity, etc.

Pending Publication Date: 2021-02-02
OUTOTEC FINDLAND OY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Such low concentrations make measurements difficult because the intensity of the fluorescent radiation from the element of interest is very low, which inevitably increases the effect of statistical errors

Method used

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  • X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry
  • X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry
  • X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry

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Embodiment Construction

[0055] figure 1 An example showing the principle of using an X-ray fluorescence analyzer in an industrial process. For industrial processes it is common that the sample to be analyzed may come as a more or less continuous stream of sample material, so there are sample handling units or systems that bring the sample into analysis and remove it after analysis. exist figure 1 In the schematic illustration of , the sample 101 arrives as a flow of sample material on a conveyor 102, which here constitutes a sample processing system. An X-ray source 103 generates a beam 104 of incident X-rays which hits a portion of the sample 101 within the field of view of the beam 104 . Fluorescent X-rays 105 are emitted in all directions, and some of them are collected into figure 1 The detection system in the present invention includes a first slit 106 , a wavelength-dispersive (wavelength-dispersive) diffractometer crystal 107 , a second slit 108 and a radiation detector 109 . The plant may...

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Abstract

X-ray fluorescence analyzer system comprises an X-ray tube (402), a slurry handling unit (201), and a crystal diffractor (601) located in a first direction from said slurry handling unit (201). The crystal diffractor (601) separates a predefined wavelength range from fluorescent X-rays (207) that propagate into said first direction, and directs the fluorescent X-rays in the separated predefined wavelength range to a radiation detector (602, 1605). The crystal diffractor (601) comprises a pyrolytic graphite crystal (603). Said predefined wavelength range comprises characteristic fluorescent radiation of a predefined element of interest with its atomic number Z between 41 and 60 the ends included. An energy resolution of said radiation detector (602, 1605) is better than 600 eV at the energyof said characteristic fluorescent radiation.

Description

technical field [0001] The invention relates to the technical field of X-ray fluorescence analysis. In particular, the present invention relates to the task of detecting relatively small amounts of characteristic fluorescent radiation of a predetermined element of interest with Z between 41 and 60 inclusive in a slurry sample. Background technique [0002] X-ray fluorescence analysis can be used to detect the presence and measure the concentration of an element of interest in a matrix of other elements. For example, in the mining industry it is important to know whether and how much a mineral or metal of interest is present in a sample. To be applicable in industrial processes, X-ray fluorescence analysis methods should be quite precise even with relatively short exposure times, and can be implemented with robust and mechanically reliable measuring devices. [0003] A specific application of X-ray fluorescence analysis in the mining industry is the analysis of elements of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/207G01N23/223G21K1/06G01T1/16C22B3/02
CPCG01N23/223G21K2201/062G01N2223/616B03B13/06G21K1/06G01N23/2076C22B3/02G01T1/16
Inventor H·西皮拉A·佩里T·科斯基宁
Owner OUTOTEC FINDLAND OY