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Infant strap bearing impact testing machine

An impact testing machine and impact testing technology, applied in impact testing, testing of machine/structural components, measuring devices, etc., can solve the problems of simple structure, unsatisfactory test effect, low reliability of testing machine structure, etc., and achieve structural simple effect

Inactive Publication Date: 2021-02-05
东莞市恒宇仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the structure of the current impact testing machine is simple, and the impact simulation is only realized through the cylinder, the test effect is not ideal, and the structural reliability of the testing machine is relatively low

Method used

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  • Infant strap bearing impact testing machine
  • Infant strap bearing impact testing machine
  • Infant strap bearing impact testing machine

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Embodiment Construction

[0016]In order to make the objectives, technical solutions, and advantages of this application clearer, the following describes and illustrates this application with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the application, and not used to limit the application. Based on the embodiments provided in this application, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of this application. In addition, it can also be understood that although the efforts made in this development process may be complicated and lengthy, for those of ordinary skill in the art related to the content disclosed in this application, the technology disclosed in this application Some design, manufacturing, or production changes based on the content are just conventional technical means, and should not be understood that the con...

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PUM

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Abstract

The invention discloses an infant strap bearing impact testing machine, which comprises a gantry rack, a measuring device, and an impact test device, wherein the gantry rack is provided with a PLC control device; the measuring device is connected with the PLC control device, is arranged at the bottom of the gantry rack and is used for measuring test parameters of an object reaching the measuring range of the measuring device, and the test parameters at least comprise one of a time parameter and a speed parameter; and the impact test device is connected with the PLC control device, is arrangedat the top of the gantry rack and is used for clamping and fixing the infant straps and simulating the process of up-down impact and free straight falling through a speed reducing motor and an eccentric assembly. According to the invention, the defects of simple structure and low reliability of the testing machine in the prior art are solved, the reliability of the testing machine is greatly improved, and the overall assembly structure is simple.

Description

Technical field[0001]The invention relates to the technical field of impact testing, in particular to a load-bearing impact testing machine for infant harnesses.Background technique[0002]An important part of the current load-bearing impact testing of infant slings is impact testing, which is to allow the sample to move up and down repeatedly at a certain speed, then lift the sample up, fall freely, and repeat the test for a certain period of time. Check its use function. However, the current impact testing machine has a simple structure, and the impact simulation is realized only by a cylinder, its test effect is not ideal, and the structural reliability of the testing machine is relatively low.Summary of the invention[0003]The technical problem to be solved by the present invention is to provide a load-bearing impact tester for infant harnesses in view of the above-mentioned shortcomings of the prior art.[0004]In order to solve the above technical problems, the technical solution a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M7/08
CPCG01M7/08
Inventor 靳慧达李润泽
Owner 东莞市恒宇仪器有限公司