Testing device and testing method for testing electromagnetic interference of chip

A technology of electromagnetic interference and testing equipment, which is applied in the direction of measuring equipment, measuring interference from external sources, measuring electricity, etc., can solve the problems of no chip electromagnetic interference testing equipment or platform, and no suitable EFT testing equipment, etc., to improve anti-electromagnetic interference Ability, improve the effect of anti-interference ability

Inactive Publication Date: 2021-03-16
BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, there is currently no equipment or platform for EMI tes

Method used

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  • Testing device and testing method for testing electromagnetic interference of chip
  • Testing device and testing method for testing electromagnetic interference of chip
  • Testing device and testing method for testing electromagnetic interference of chip

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[0038] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS It should be understood that the specific embodiments described herein are intended to illustrate and explain the present invention and is not intended to limit the invention.

[0039] The term "first" herein, "second" is used only for distinguishing description, and cannot be understood as an indication or implies relative importance. Herein, the "connection" used to describe the electrical power connection between two components or signal connection; "connected" may be directly connected to two elements, or may be connected via an intermediate medium (e.g. wire), also may be a Indirect connection implemented by the third component.

[0040] figure 1 A structural diagram of a test apparatus for a chip electromagnetic interference test according to an embodiment of the present invention;

[0041] figure 2 It is a structural diagram (cross-sectional view) of a test panel for a test device for chip electromagnetic interfer...

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Abstract

The invention relates to the technical field of electromagnetic interference testing, and provides a testing device and a testing method for chip electromagnetic interference testing. The testing device comprises a test mainboard, a signal generator, a coupling network probe and a test daughter board used for placing a chip. The test daughter board comprises a lead-out circuit correspondingly connected with a plurality of pins of the chip; the coupling network probe is connected with a leading-out circuit and the signal generator and is used for transmitting an electromagnetic interference signal generated by the signal generator to the leading-out circuit so as to lead the electromagnetic interference signal into the chip through the leading-out circuit; and the test mainboard is connected with the test daughter board and is used for acquiring signal data generated by the chip under the interference of the electromagnetic interference signal. By directly introducing the electromagnetic interference signal into the integrated circuit chip, the anti-electromagnetic interference capability of each pin of the chip is accurately evaluated, reference is provided for improving the internal circuit design of the chip, and the anti-electromagnetic interference capability of the chip is improved.

Description

technical field [0001] The invention relates to the technical field of electromagnetic interference testing, in particular to a testing device for chip electromagnetic interference testing and a chip electromagnetic interference testing method. Background technique [0002] At present, the electromagnetic interference tests for electronic products are all at the equipment level. The anti-electromagnetic interference performance of the overall equipment or system is evaluated by testing the whole machine, such as Electrical Fast Transient (EFT) for electronic equipment. test. [0003] With the development of integrated circuits, the structure of equipment involved in intelligent manufacturing, artificial intelligence, power industry, rail transit and other fields is becoming more and more complex, and tends to be multi-functional and miniaturized. These devices contain a large number of basic components, through which various functions are realized. As a typical basic compo...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/002
Inventor 田露乔彦彬李纪平张婧晶宋蕾原义栋张海峰
Owner BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY
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