Testing device and testing method for testing electromagnetic interference of chip
A technology of electromagnetic interference and testing equipment, which is applied in the direction of measuring equipment, measuring interference from external sources, measuring electricity, etc., can solve the problems of no chip electromagnetic interference testing equipment or platform, and no suitable EFT testing equipment, etc., to improve anti-electromagnetic interference Ability, improve the effect of anti-interference ability
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[0038] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS It should be understood that the specific embodiments described herein are intended to illustrate and explain the present invention and is not intended to limit the invention.
[0039] The term "first" herein, "second" is used only for distinguishing description, and cannot be understood as an indication or implies relative importance. Herein, the "connection" used to describe the electrical power connection between two components or signal connection; "connected" may be directly connected to two elements, or may be connected via an intermediate medium (e.g. wire), also may be a Indirect connection implemented by the third component.
[0040] figure 1 A structural diagram of a test apparatus for a chip electromagnetic interference test according to an embodiment of the present invention;
[0041] figure 2 It is a structural diagram (cross-sectional view) of a test panel for a test device for chip electromagnetic interfer...
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