Bayesian semi-supervised robust PPLS soft measurement method based on incomplete data
A complete data, soft measurement technology, applied in the direction of instruments, character and pattern recognition, computer components, etc.
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[0152] Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:
[0153] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0154] A Bayesian semi-supervised robust PPLS soft sensor method based on incomplete data, including Bayesian semi-supervised robust PPLS model of incomplete data and model parameter learning of Bayesian variational inference; the details are as follows step;
[0155] Step 1, initialize the prior distribution parameters and hidden...
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