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Real-time FPGA error detection method based on standard input and output verification

A standard input and error detection technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of incomplete detection content, detection circuit failure probability and other problems, and achieve the effect of ensuring reliability

Active Publication Date: 2021-05-14
XIDIAN UNIV
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Problems solved by technology

[0006] The purpose of the present invention is to address the above-mentioned deficiencies in the prior art, to propose a real-time FPGA error detection method based on standard input and output verification, and to monitor the hardware platform information online in real time through the coprocessor side, so as to solve the detection problems existing in the prior art Technical problems of incomplete content and probability of faults being concealed in self-detection circuits

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  • Real-time FPGA error detection method based on standard input and output verification
  • Real-time FPGA error detection method based on standard input and output verification
  • Real-time FPGA error detection method based on standard input and output verification

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[0056] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention, and the detailed description is as follows.

[0057] The present invention proposes a real-time FPGA error detection method based on standard input and output verification. The method obtains the development text information of the interleaved accompanying circuit arranged in the detection object circuit module; calculates and obtains the required standard input and output data for testing the interleaved accompanying circuit ;In the working environment, the standard input data is processed by the interleaved accompanying circuit to obtain the processed output data; the cop...

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Abstract

The invention discloses a real-time FPGA error detection method based on standard input and output verification. The real-time FPGA error detection method comprises the following steps of 1, acquiring key data information of an interlaced adjoint circuit A` in each detection object module A at an FPGA end, 2, acquiring processing time information, input data and output data of an interlaced adjoint circuit through calculation according to the data information obtained in the step 1, 3, respectively importing the data information obtained in the step 1 and the step 2 into a coprocessor end, and carrying out real-time monitoring on the state of each interlaced adjoint circuit at the FPGA end, and 4, after an error is monitored, counting error information of each interlaced adjoint circuit according to an error detection method, and indicating an error module in the detection object circuit. According to the method, hardware platform information is monitored in real time through the coprocessor end, whether the SEU effect occurs in the module circuit to be detected or not can be accurately detected after experimental verification, and the method is completely suitable for the actual detection requirement of the SEU effect in FPGA equipment.

Description

technical field [0001] The invention belongs to the technical field of on-chip system detection, and in particular relates to a real-time FPGA error detection method based on standard input and output verification, which is used for fault detection and analysis of the single event effect of the FPGA system. Background technique [0002] Large-scale Field Programmable Gate Array (FPGA) is widely used in aerospace engineering because of its flexible design, short development cycle, and low cost. However, with the continuous development of integrated circuit technology, the integration level continues to increase. , Nano-scale integrated circuits are subject to system failures such as logic state reversal or circuit failure caused by high-energy particle collisions, which seriously affect the reliability and safety of electronic equipment. Therefore, in view of the increasingly serious single event effect problem, it is very important to improve the reliability of FPGA equipmen...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/3181G01R31/3185
CPCG01R31/3181G01R31/318519
Inventor 闫允一程首豪高翔宫江雷
Owner XIDIAN UNIV