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Sorting method, sorting device, computer readable storage medium and electronic equipment

A kind of sorting and optoelectronic technology, which is applied in computing, sorting, image analysis, etc., can solve the problems of multiple chip test data mismatch and waste of full-page chips

Pending Publication Date: 2021-06-18
CHONGQING KONKA PHOTOELECTRIC TECH RES INST CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of the above-mentioned deficiencies in the prior art, the purpose of this application is to provide a sorting method, which aims to solve the problem that the test data of multiple chips in the sorting method do not match, resulting in the waste of the entire chip

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  • Sorting method, sorting device, computer readable storage medium and electronic equipment
  • Sorting method, sorting device, computer readable storage medium and electronic equipment
  • Sorting method, sorting device, computer readable storage medium and electronic equipment

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Embodiment Construction

[0063] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Preferred embodiments of the application are shown in the accompanying drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the application more thorough and comprehensive.

[0064] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terminology used herein in the description of the application is only for the purpose of describing specific embodiments, and is not intended to limit the application.

[0065] In the existing AOI inspection, the back (light-emitting surface) inspecti...

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Abstract

The invention relates to a sorting method, a sorting device, a computer readable storage medium and electronic equipment. The sorting method is used for screening a plurality of chips at the same time, each chip comprises a first surface and a second surface which are arranged oppositely, and the method comprises the following steps: obtaining first detection data of the first surface and second detection data of the second surface of each chip; and classifying the chips according to the first detection data and the second detection data, and screening out the chips with defects. According to the sorting method, waste of the chips in the detection process can be better avoided, and the sorting accuracy is higher.

Description

technical field [0001] The present application relates to the field of chip sorting, in particular to a sorting method, a sorting device, a computer-readable storage medium and electronic equipment. Background technique [0002] Automated Optical Inspection (AOI) collects images and compares them with qualified parameters in the database to judge the obtained chip appearance level and write the results into the test data for screening by the sorting machine. [0003] In the existing AOI inspection, the back side is inspected first and then the abnormal grains are sorted out. This method is inefficient. If the sorting is done before the photoelectricity test, it will affect the test results. If the sorting is done after the photoelectricity test, it may affect the The alignment of the positive detection makes the data of each chip not aligned, resulting in a waste of the entire chip. Contents of the invention [0004] In view of the deficiencies in the prior art above, the...

Claims

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Application Information

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IPC IPC(8): B07C5/34B07C5/342B07C5/344G06T7/00
CPCB07C5/344B07C5/342B07C5/34G06T7/0004G06T2207/30148
Inventor 杨浩杨富可张嘉修
Owner CHONGQING KONKA PHOTOELECTRIC TECH RES INST CO LTD
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